TOKYO — JEOL Ltd. (President & CEO Izumi Oi) announces the development of its new low‑angle ion‑milling scanning electron microscope, HAXIS, and will commence sales on October 5, 2026. HAXIS Low-angle Ion Milling Scanning Electron Microscope Background of development As advanced semiconductor device structures continue to shrink and grow more complex, it has become difficult […]

Building a two-site demonstration laboratory system together with the semiconductor-focused facility in Bengaluru, Hitachi High-Tech aims to strengthen the provision of digitalized assets in the India market and also accelerating HMAX Industry TOKYO — Hitachi High-Tech Corporation (“Hitachi High-Tech”), has established a demonstration laboratory Advanced-Technology Innovation Center Mumbai for analytical systems in Mumbai, India (“Mumbai […]

New role reflects the enduring and growing strategic significance of the region for ZEISS’ long-term roadmap. Christian will represent ZEISS North America, lead region-wide initiatives, and identify cross-business opportunities across ZEISS Group. The North American organization will strengthen collaboration and enable faster decision-making closer to customers. Oberkochen, Germany / Dublin, CA, USA | ZEISS Group […]

Customers benefit from easier access to the comprehensive ZEISS portfolio, global expertise and tailored solutions that enable scientific and technological breakthroughs. Oberkochen, Jena / Germany | ZEISS Group Whether developing new therapies, advancing groundbreaking technologies or creating sustainable innovations, science and industry are facing increasingly complex challenges. ZEISS is therefore aligning its Industrial Quality & […]

TOKYO — JEOL Ltd. (President & CEO: Izumi Oi) has developed the benchtop scanning electron microscope (SEM) “JCM-7000Plus” and will begin sales on September 1, 2026. [Development Background] Benchtop scanning electron microscopes are increasingly used in fields including electrical and electronics, automotive and machinery, steel and metals, chemical and pharmaceuticals. They are utilized not only […]

New detector enables faster 4D STEM imaging, helping researchers uncover material properties with greater speed and detail Key highlights: Innovation: EMPAD G2 helps researchers capture more information about materials in a single scan, recording both the strongest and weakest signals without sacrificing imaging speed or data quality. Performance: EMPAD G2 runs at 10,000 frames per second […]

Tokyo, Japan — JEOL Ltd. (President & CEO: Izumi Oi) today announced the CRYO ARM™ 300S and CRYO ARM™ 200S, JEOL’s latest 300 kV and 200kV cold field-emission cryo-electron microscope that offers single-particle analysis (SPA), cryo-electron tomography (cryo-ET), 3DED/MicroED and beyond, all in one highly automated instrument. The CRYO ARM™ 300S and 200S are engineered to […]

JEOL Ltd. (President and CEO: Izumi Oi) has developed the new 300kV atomic resolution analytical microscope “GRAND ARM™ 3” and launched it on August 3, 2026. Development Background JEOL’s flagship model, the 300kV atomic resolution electron microscope, has greatly enhanced its observation and analysis capabilities as the GRAND ARM™ 3. JEOL’s joint development with CEOS […]

New detectors enable multimodal SEM analysis with breakthrough performance MILWAUKEE, Wisconsin – Bruker today announced the launch of two groundbreaking detectors at Microscopy & Microanalysis (M&M) 2026: the eWARP™ TKD, a next-generation Transmission Kikuchi Diffraction (TKD) detector for nanoscale crystallographic characterization, and the XFlash® FlatQUAD™ 2L, the latest evolution of Bruker’s annular EDS detector, enabling simultaneous Energy Dispersive […]

Tokyo, Japan — JEOL Ltd. (President & CEO: Izumi Oi) today announced the CRYO ARM™ 300S and CRYO ARM™ 200S, JEOL’s latest 300 kV and 200kV cold field-emission cryo-electron microscope that offers single-particle analysis (SPA), cryo-electron tomography (cryo-ET), 3DED/MicroED and beyond, all in one highly automated instrument. The CRYO ARM™ 300S and 200S are engineered to deliver high-resolution […]