New Advanced Automation and Usability Features on the Oxford Instruments Asylum Research Jupiter XR Large-Sample Atomic Force Microscope

Oxford Instruments Asylum Research today announces the release of new features for the Jupiter XR atomic force microscope (AFM) to increase productivity and improve usability. The Jupiter AFM will now include a side-view camera that provides a direct high-resolution view of the AFM tip – sample separation during tool setup which dramatically improves usability and reduces the risk of operator errors. The side-view camera will be included on new Jupiter systems and is available as an upgrade to existing systems.

With the new Advanced Automation package, powerful recipes or workflows can be created to automate at different locations in the stage. The new software package ensures that measurements are made with consistent best-known practices while also improving efficiency and usability.

“The Jupiter XR has established itself as the premier large-sample AFM, with high-resolution imaging performance that improves measurement accuracy and precision, fast scanning capability that improves productivity, and exclusive blueDrive tapping mode technology that improves usability and measurement repeatability,” said Dr. Ben Ohler, Senior Product Line Manager at Oxford Instruments Asylum Research. “Now, with the release of our Advanced Automation package and side-view camera, we are making it easier for customers to realize those performance advantages in a safer and more productive manner.”

In recognition of Asylum Research’s 25th anniversary, from now until March 31, 2024, both the new Advanced Automation and Kelvin Probe Force Microscopy software packages will be offered at 25% off list price for existing customers. To receive a quote for this promotion, please contact mailto:[email protected].

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About Oxford Instruments Asylum Research

Oxford Instruments Asylum Research is the technology leader in atomic force microscopy for both materials and bioscience research. Asylum Research AFMs are widely used by both academic and industrial researchers for characterizing samples from diverse fields spanning material science, polymers, thin films, energy research, and biophysics. In addition to routine imaging of sample topography and roughness, Asylum Research AFMs also offer unmatched resolution and quantitative measurement capability for nanoelectrical, nanomechanical, and electromechanical characterization. Recent advances have made these measurements far simpler and more automated for increased consistency and productivity. Its Cypher, MFP-3D, Jupiter, and Vero AFM product lines span a wide range of performance, versatility, and budgets.

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