SPM-9700 Scanning Probe Microscope

With the release of a new scanning probe microscope (SPM-9700) featuring new software that sets a new standard for easy operation, Shimadzu Corporation has launched a market offensive in the field of scanning probe microscopes. From observation to data analysis, operations are easier, while providing high quality data.

Scanning probe microscopes (SPM) are used to observe the three-dimensional image of sample surfaces at high magnifications by scanning the sample surface with an extremely sharp probe. They allow observing the surfaces of metals, semiconductors, ceramics, organic matter, biological organisms, and other samples at high magnifications, ranging from a few 1000 times to a few million times magnification, without pretreating the surfaces. They also offer superior vertical resolution, in the direction of sample height, which enables precisely measuring the roughness of material surfaces. In addition to allowing high resolution observation in the nanometer range, they are also capable of observing samples in either atmospheric conditions or in liquids. Such applications are spreading in research fields, such as surface physics, electronics, chemistry, and biology, and has contributed to the development of nanosciences and nanotechnologies.

Note: 1 nanometer = 10-9 m, which is about the diameter of a protein molecule or a DNA double-helix structure.

The new SPM-9700 is the successor model to the SPM-9600 scanning probe microscope, which has earned a reputation among users for its easy operation and clear and high quality images. This new model not only offers further improvements to ease-of-operation for general users, which is one of Shimadzu’s strengths, but also features higher performance and stability levels for the main unit.

New Product Features

The new product includes newly developed Windows 7-compatible software featuring an updated GUI (graphical user interface) design. The new software also includes a new guidance function, that enables anyone to confidently perform operations from observing samples to analyzing data, by simply following procedures displayed on the screen. In addition to displaying the observation point and range in an easy to understand manner, it also features a navigation function that allows freely navigating from a broad field of view to any specific area desired.

Furthermore, it now permits displaying up to 8 observation images (the previous model offered 2). Observation windows are partitioned off from guidance and parameter setting windows, so they are not hidden by other windows. Saved images can be displayed easily as well.

Operability has been improved significantly in other ways as well, such as with improved SPM manager functionality, that enables saving settings separately for each user and performing required observations smoothly after startup, in the user’s preferred observation mode.

The following summaries the key features of the new product.

Easy Operation Using New Software

The new software utilizes an innovative interface with a freely configurable layout that facilitates all steps, from sample observation to data analysis. It features a guidance function that allows users to observe samples by simply following the procedures displayed on the screen and a navigation function that more clearly indicates the location being observed and enables freely navigating from a broad field of view to any specific area desired. More easily recognized icons and buttons help users access the desired functions more quickly and enable confirming the instrument status at a glance.

Improved Observation Window Functionality – Simultaneously Displays a Maximum 8 Images

The previous model permitted simultaneously displaying up to 2 observation windows, but now a maximum of 8 images can be displayed. This allows comparing observation images more efficiently. Observation images are partitioned off from guidance and parameter setting windows, so they are not hidden by other windows. Saved images can be displayed easily as well.

3D Display Function

The software now includes a new 3D display function (3D-Ex) that allows using the mouse to freely rotate images, zoom, or change the Z-axis magnification factor while confirming the images in real time.

The SPM market in Japan is currently about 3 billion yen, but demand is expected to grow for easy to operate systems in the sub-micron to nanometer range (1 nm to 100 nm range), for use in materials development and inspection applications. Given such market trends, Shimadzu aims to significantly increase its share of the SPM market by introducing new products with higher performance, increased expandability, and improved ease-of-operation.