Protochips releases AXON software to redefine the TEM experience The field of electron microscopy has long demanded a high level of skill and effort to run experiments in their native environment (in situ). Although these results have shed new light on many fields of science, the complexity of in situ experiments has been a barrier to widespread […]

TOKYO – Evolution of Integrated EPMA – JEOL Ltd. (6951.T) (President & COO Izumi Oi) announces the release of a new Schottky field emission Electron Probe Microanalyzer JXA-iHP200F and a new tungsten/LaB6 Electron Probe Microanalyzer JXA-iSP100, to be released in November 2019. Product Development Background Electron Probe Microanalyzers (EPMAs) are used as tools for research & […]

Next-generation, cost-effective solution for front- and back-side edits enables rapid prototyping PORTLAND, Ore. — Circuit edit (CE) engineers, whether supporting designers or in service labs, who are looking for a cost-effective solution can increase their productivity with the next-generation Thermo Scientific Centrios circuit edit system. Announced today at the International Symposium for Testing and Failure Analysis (ISTFA) […]

Hitachi High-Technologies Corporation (TSE:8036/Hitachi High-Tech) have undertaken a third-party allotment of shares (this capital alliance) with Vironova AB (Main office: Stockholm, Sweden /CEO: Mohammed Homman/Vironova), who develop and sell analysis software for transmission electron microscopes (TEM) along with carrying out contract analysis for pharmaceutical companies. Through this capital alliance, we aim to jointly develop TEM […]

Latest DualBeam system provides significant clarity of protein interactions HILLSBORO, Ore. — Thermo Fisher Scientific today announced the Thermo Scientific Aquilos 2 Cryo-FIB, a DualBeam system dedicated to the preparation of thin, electron-transparent samples from biological specimens. It simplifies the cryo-electron tomography (cryo-ET) workflow by reducing sample preparation time, minimizing the risk of contamination and providing a […]

A unique combination of plasma FIB and field-free UHR FE-SEM for the widest range of materials characterization applications Brno, Czech Republic – As the first SEM manufacturer to commercialize integrated xenon plasma FIB with the SEM, TESCAN proudly announces TESCAN AMBER X. TESCAN AMBER X is a new FIB-SEM solution that combines high throughput plasma-assisted […]

EAG Laboratories proudly announces the launch of a new laboratory in China dedicated to improving materials, products and electronics. Newly built in Shanghai, this facility brings the most advanced imaging and surface analysis expertise and technology to China, providing manufacturers with direct access to scientific expertise in the analysis of physical structures, chemical properties and […]

The New TESCAN CLARA SEM Pushes the Boundaries of Materials Characterization, unique detection system allowing advanced contrast for Materials Brno, Czech Republic – TESCAN CLARA, Ultra-High Resolution Scanning Electron Microscope (SEM) takes materials characterization to the next level. Building on the technological success of the S8000 platform, the CLARA is an extremely versatile SEM designed […]

Developed to enable the reliable, consistent and scalable application of cryo-electron microscopy to protein research and drug discovery chameleon to be showcased at Microscopy & Microanalysis 2019 in Portland, Oregon, August 4–8   Cambridge, UK: TTP Labtech Ltd, a global leader in the design and development of automated instrumentation and consumables for life science applications, has today announced the […]

― The next level of analytical intelligence in FE-SEM for combining high resolution and operability ― TOKYO–JEOL Ltd. (TOKYO:6951) (www.jeol.com) (President & COO Izumi Oi) announces the release of a new Schottky field emission scanning electron microscope, JSM-F100 in August 2019. https://www.jeol.co.jp/en/news/detail/20190804.3456.html Background Scanning electron microscopes(SEMs) are used in various fields; nanotechnology, metals, semiconductors, ceramics, […]