JEOL Ltd. (President Gon-emon Kurihara) and Tohoku University (President Susumu Satomi) formally started a collaboration on “Research and development of Soft X-Ray Emission Spectrometer and the construction of spectrum database” in April 1, 2017. The Soft X-Ray Emission Spectrometer (SXES) is an ultra-high resolution spectrometer for electron microscope consists of a newly-developed diffraction grating and […]

TESCAN GAIA in Fabrinet – A Trusted Manufacturing Partner of the World’s Most Demanding OEMs Fabrinet is a company focused on manufacturing components and modules for optical communication systems as well as industrial lasers and sensors. It has become a trusted manufacturing partner for the world’s most demanding OEMs. Fabrinet now provides manufacturing, packaging, process […]

LA JOLLA–The Salk Institute’s Waitt Advanced Biophotonics Center and ZEISS announced today a global partnership to accelerate the frontiers of microscopy and imaging technologies. The Waitt Center, launched in 2011 with a landmark $20 million gift from Salk Board Chair Ted Waitt’s Waitt Foundation and supported by federal grants, serves as a state-of-the-art research hub, […]

Highest quality data and easiest operation (Peabody, Mass.) – JEOL USA, Inc. introduces its new premier Field Emission SEM, the JSM-7900F, a uniquely flexible platform that combines the ultimate in high resolution imaging with unparalleled nano scale microanalysis.  This tool excels in lightning fast data acquisition through simple and automated operation. Applications include imaging and analysis of […]

JEOL Ltd. (President Gon-emon Kurihara) announces a new Schottky field emission scanning electron microscope, JSM-7900F, to be released in May 2017. Product development background Scanning electron microscopy has been in increasing demand in a wide range of applications including nanotechnology, metals, semiconductors, ceramics, medicine, and biology. As advanced materials feature an increasingly smaller, finer structure, […]

– High-Quality Imaging with Improved Resolution, Higher Magnification, and New Functions – Tokyo, Japan – Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced the introduction of the new Regulus series of field emission scanning electron microscopes (FE-SEM) on May 30. As a new brand for FE-SEMs, the Regulus series lineup comprises four models: the Regulus8100, […]

Laughton, United Kingdom: Quorum Technologies, market and technology leaders in electron microscopy coating and cryogenic preparation products, report on how Carl Zeiss Microscopy has incorporated their Q150T coater into their ruggedized analytical solutions supplied to the mining, geosciences and oil & gas sectors. Shaun Graham is part of the applications development team at Carl Zeiss […]

Woolpit, United Kingdom: Deben, a leading provider of in-situ testing stages together with innovative accessories and components for electron microscopy, reports on the use of the AFSEM™ correlative AFM & SEM system with their tensile stage for in situ mechanical test and measurement. Manufactured by GETec, it will be sold by Nanosurf and other selected […]

Oxford Instruments, a global leader in microanalysis systems, has launched Symmetry the world’s first CMOS-based electron backscatter diffraction (EBSD) detector. Symmetry represents a significant breakthrough compared to conventional CCD-based detectors: an unrivalled top acquisition speed in excess of 3000 indexed patterns per second (pps) is uniquely balanced by uncompromising sensitivity and data quality, providing up […]