Oxford Instruments, a global leader in microanalysis systems, has introduced a real-time navigation and imaging system for the SEM that helps users interactively explore their sample based on video-rate X-ray maps coloured by element rather than just the black and white electron image alone.  Unlike traditional static approaches to elemental analysis that need the user […]

WITec’s solution for correlative Raman-SEM imaging is now available for ZEISS Sigma 300, a field emission scanning electron microscope (FE-SEM). With this jointly-developed system, WITec and ZEISS have furthered their collaboration to provide a fully-integrated instrument available as an OEM product through ZEISS that features a standard, unmodified vacuum chamber and SEM column along with […]

Combined Solution Accelerates Electron Microscopy Workflows with Next-Generation, High-Resolution Cameras and Best-In-Class, High-Performance Data Storage SANTA CLARA, Calif. — DataDirect Networks (DDN®) today announced a strategic partnership with Gatan®, the world’s leading manufacturer of instrumentation and software used to enhance and extend the operation and performance of electron microscopes, to deliver groundbreaking solutions for microscopy research environments […]

New Thermo Scientific Aquilos FIB/SEM protects sample integrity and enhances productivity for cryo-electron tomography workflow ST. LOUIS — Microscopy & Microanalysis 2017 – The new Thermo Scientific Aquilos is the first commercial cryo-DualBeam (focused ion beam/scanning electron microscope) system dedicated to the preparation of frozen, thin lamella samples from biological specimens for high-resolution tomographic imaging in a […]

New Thermo Scientific Krios G3i raises bar for performance, automation and time-to-results Breakthrough Thermo Scientific Glacios provides a cryo-EM entry path for a broader range of researchers   ST. LOUIS — Microscopy & Microanalysis 2017 — Thermo Fisher Scientific, the world leader in serving science, has extended its leadership in cryo-electron microscopy (cryo-EM) with the introduction of […]

Thermo Scientific Quattro ESEM allows materials science researchers to study nanoscale structure in almost any material under a range of environmental conditions ST. LOUIS — Microscopy & Microanalysis 2017 — The ability of scientists to study samples at the nanometer scale and in natural conditions and environments is critical to the discovery and development of new materials […]

New compact S/TEM can be configured to meet specific imaging and analytical requirements for materials characterization in research laboratories ST. LOUIS — Microscopy & Microanalysis 2017 — Research laboratories can now address a wide range of high-end material characterization applications using the latest innovation from the Talos product line. The new Thermo Scientific Talos F200i is a […]

JEOL Ltd. (President Gon-emon Kurihara) announces the release of a new scanning electron microscope (SEM), the JSM-IT500HR for unprecedentedly high throughput, to be released in August 2017. Product development background Scanning electron microscopes are used in a wide range of fields, such as nanotechnology, metals, semiconductors, ceramics, medicine, and biology. In addition, SEM applications are […]

Celebrating 10 Years of Desktop SEM Innovation Phoenix, Arizona Nanoscience Instruments is proud to introduce the 5th generation Phenom Pro and ProX SEMs by Phenom-World. The introduction of this new generation SEM celebrates ten years of Desktop SEM innovation from Phenom World. The new generation features enhanced imaging, 20 percent real electro-optical resolution improvement, new […]

  Three-dimensional models allow height measurements A 3-dimensional model can be generated without sample tilting and alignment, using 4-segment backscattered electron detector. Features Specifications Hitachi map 3D software overview Technical magazine “SI NEWS” This journal addresses a wide range variety of research papers and useful application data using Hitachi science instruments. nanoart Photo collections of […]