TESCAN announces the launch of training network ELENA

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TESCAN is happy to announce the launch of the Horizon 2020 training network ELENA – Low energy ELEctron driven chemistry for the advancement of emerging NAno-fabrication methods. The project is part of the Marie Skłodowska-Curie Innovative Training Network ELENA in which young researchers investigate the chemistry and physics involved in two emerging techniques for creating […]

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Release of the JIB-4700F, a New Multi Beam System (Focused Ion Beam-Scanning Electron Microscope (FIB-SEM)) – High Resolution, High Throughput System for Nano Milling and Analysis –

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JEOL Ltd. (President Gon-emon Kurihara) announces the release of the JIB-4700F Multi Beam System, a newly-developed FIB-SEM instrument to be distributed in January 5, 2017. Product development background Advances in the development of new materials featuring complex nanostructures places increased demands on FIB-SEM instruments for exceptional resolution, accuracy and throughput. In response, JEOL has developed […]

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