Georg von Erffa will be the new Head of Corporate Human Resources (CHR). He will succeed Susan-Stefanie Breitkopf, who was appointed Chief Transformation Officer (CTO) on the Executive Board of Carl Zeiss AG from 1 July 2022. Arlett Hesse will take on the newly created role of Head of CHR Germany. Oberkochen, Germany — Effective […]

(M&M 2022 Portland, Oregon) — JEOL, the global leader in the development of cutting-edge Electron Microscopes for materials characterization and analysis, introduces its latest Energy Dispersive Spectrometer (EDS), the Gather-X. This new windowless EDS answers the need for higher sensitivity and low-energy X-Ray detection in the Scanning Electron Microscope (SEM). It can collect the entire […]

DECTRIS is proud to introduce its latest development: DECTRIS ARINA, a new hybrid-pixel electron detector designed for 4D STEM applications. This detector model was first presented to the community at the M&M 2022 in Portland and will be available for ordering in summer 2023.  In the meantime, DECTRIS will continue its collaboration with industrial and academic […]

Thermo Scientific Arctis Cryo-Plasma FIB enables speed and consistency of cellular cryo-electron tomography HILLSBORO, Ore. – Thermo Fisher Scientific Inc., the world leader in serving science, today unveiled the Thermo Scientific Arctis Cryo-Plasma Focused Ion Beam (Cryo-PFIB), a new connected and automated microscope designed to advance the pace of cryo-electron tomography (cryo-ET) research. Cryo-ET makes […]

Deep learning cell segmentation algorithm incorporated into Aivia 11 update Wetzlar, Germany – Leica Microsystems, a leader in microscopy and scientific instrumentation, has released a new version of its AI-powered image analysis solution, Aivia. The new Aivia 11 features a new deep learning-based cell segmentation algorithm that offers advanced insight creation capabilities for all levels of users. […]

FAPS will use the FIB-SEM for silver printing and copper coating analysis in an effort to improve mechatronic systems, battery components, additive manufacturing and more Brno, Czech Republic, and Erlangen, Germany ― TESCAN ORSAY HOLDING a.s. announces the installation of the AMBER X focused ion beam-scanning electron microscope (FIB-SEM) at the Institute for Factory Automation […]

FAPS will use the FIB-SEM for silver printing and copper coating analysis in an effort to improve mechatronic systems, battery components, additive manufacturing and more. Brno, Czech Republic, and Erlangen, Germany ― TESCAN ORSAY HOLDING a.s. announces the installation of the AMBER X focused ion beam-scanning electron microscope (FIB-SEM) at the Institute for Factory Automation and Production […]

Santa Barbara, CA — Oxford Instruments Asylum Research today announced the launch of the new Cypher L atomic force microscope (AFM). Based on the acclaimed high-performance Cypher AFM platform, the Cypher L is designed for researchers who need core AFM capabilities in research markets including polymers, 2D materials, quantum technology, and energy storage. The Cypher […]

SUWON, South Korea — Park Systems, the world’s leading manufacturer of atomic force microscopes (AFM) is proud to award the Park Systems AFM Scholarship to Gen Liu at Tianjin International Center for Nanoparticles and Nanosystems (TICNN), Tianjin University, China for his research on SECCM. Scanning electrochemical cell microscope is the latest generation of scanning electrochemical microscopy technology. It is designed to […]

Chigasaki, Japan – ULVAC-PHI Incorporated has launched the PHI GENESIS, an automated and multi-function scanning X-ray photoelectron spectrometer (XPS: X-ray Photoelectron Spectroscopy or ESCA: Electron Spectroscopy for Chemical Analysis). The PHI GENESIS is the united model of PHI’s multi-functional scanning XPS instruments and was designed for automation and simplified operation. Background Advanced materials such as […]