Increased Total Throughput and Improved Reliability – Tokyo – Hitachi High-Tech Corporation (President and CEO: Takashi Iizumi / Hitachi High-Tech) announced the launch of both AFM100 and AFM100 Plus systems – entry-level and intermediate-level models of Hitachi’s compact and versatile Atomic Force Microscopes (AFM). These tools are designed to offer ease of use and superior […]

New solution promises to accelerate experimental success and improve process reliability as industry looks to faster drug discovery post-Covid Wetzlar, Germany — Leica Microsystems has today announced the launch of the Leica Nano workflow: a new live-cell correlative light and electron microscopy (CLEM) workflow solution designed to increase experimental success rates, improve reproducibility, and simplify […]

FIB-SEM is now available to researchers across the Institute for use in characterization, nanofabrication, and rapid prototyping. MIT.nano has acquired a Raith VELION focused ion beam scanning electron microscope (FIB-SEM) as a demonstration unit in its characterization facility. The instrument, which arrived on campus last summer, has been installed and qualified in the lower level […]

The new systems offers a wide range of nanoscale tools for researchers at Skoltech and other basic and applied research institutes, biomedical research centers, and industry in Russia. Notably, the new microscope will be used by Skoltech leading scientists as a development platform for creating fundamentally new experimental approaches contributing to the development of new […]

A Turnkey Solution for Molecular Structure Determination for Nanocrystals Rigaku Corporation (Headquarters: Akishima, Tokyo, Japan; Chairman & CEO: Hikaru Shimura), a leading company producing X-ray analysis instruments, and JEOL Ltd. (Headquarters: Akishima, Tokyo, Japan; President & COO: Izumi Oi), a leading company producing electron microscopes and other analytical instruments, have announced the launch of the […]

TESCAN Plasma FIB delayering capability provides a turnkey, time-saving solution for automated device delayering on today’s advanced technology nodes Brno, Czech Republic — TESCAN ORSAY HOLDING a.s. announces the release of the new TESCAN Delayering Module that enables automated gas-assisted top-down delayering using TESCAN SOLARIS X and AMBER X Plasma focused ion beam (FIB) instruments. […]

HILLSBORO, Ore. — Thermo Fisher Scientific, the world leader in serving science, has developed a custom-built high-resolution scanning transmission electron microscope ((S)TEM) to support advanced materials research at Monash University. The instrument is being installed in the Monash Centre for Electron Microscopy (MCEM) in Melbourne, Australia, a node of Microscopy Australia. The Thermo Scientific Spectra φ is configured […]