SANTA BARBARA, California – Bruker has released the NanoMechanics Lab™, a suite of force-mapping modes that enable Dimension FastScan® and Icon® AFM systems to perform quantitative nanoscale characterization, extending from soft hydrogels and polymers to stiff metals and ceramics. The NanoMechanics Lab encompasses a broad range of nanoscale AFM measurement techniques, including the well-established Force Volume mode, as well as the new high-accuracy […]

NT-MDT SI announces the termination of its employment agreement with Mr. Dmitry Kozodaev, our European regional sales manager, effective from April 1st 2017. We would like to thank Mr. Dmitry Kozodaev for his service over the past 10 years and wish him good luck with his recently developed company. NT-MDT SI does not take any […]

HORIBA CLUE Series offer a scalable platform for imaging and spectroscopic analysis of nano-objects with SEM and dual SEM/FIB (Focused Ion Beam) microscopes. HORIBA Scientific, global leader in spectroscopic analysis for over 40 years, is proud to announce the new HORIBA CLUE Series detectors for Scanning Electron Microscopes (SEM). HORIBA CLUE Series include: i-CLUE fast […]

Oxford Instruments NanoScience announces the long-term collaboration agreement signed with CASmF Science and Technology Limited (CASmF) in China, to jointly develop high precision Scanning Probe Microscope (SPM) products using TeslatronPT, the Cryofree® superconducting magnet system from Oxford Instruments. SPM products form images of surfaces using a physical probe that scans the specimen. The SPM probe when used with TestatronPT can be […]

The atomic force microscope ToscaTM 400 by Anton Paar is available for sale now. This high-end product measures nano-surface properties and was specially designed for industrial users. Thanks to the automation on every level of operation, ToscaTM 400 is easy to handle. Until now atomic force microscopes were complex and rather complicate to operate thus they were – and […]

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the Skládal Research Group at Masaryk University, Brno, Czech Republic. They are studying biomolecules and cells with JPK’s NanoWizard® AFM and ForceRobot® systems as part of a development of new biosensors. Dr Jan Pribyl is Deputy Group […]

Shimadzu Corporation announces the release of its flagship SPM-8100FM scanning probe microscope, featuring five times faster data acquisition, four times wider scan in both X and Y-axis directions, and ultra-high resolution performance that is as high in both air and liquids as in a vacuum. A scanning probe microscope (SPM) is a microscope that scans […]

SANTA CLARA, Calif. Park Systems, world-leading manufacturer of Atomic Force Microscopes (AFM), just announced new Park NX12, an affordable versatile platform for analytical chemistry and electrochemistry researchers and multi-user facilities. Park NX12 features a versatile Inverted Optical Microscope (IOM) based SPM platform for SICM, SECM, and SECCM, in addition to Atomic Force Microscopy for research […]

(Berlin.) JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, is pleased to announce a new demonstration capability at their Berlin headquarters. In collaboration with Abberior Instruments, visitors to JPK’s applications facility will be able to see STED capability demonstrated in conjunction with the NanoWizard® AFMs. Following collaboration […]

JEOL Ltd. (President Gon-emon Kurihara) announces the release of a new atomic resolution analytical electron microscope, “NEOARM” (JEM-ARM200F), to be released in June 2017. Product development background The transmission electron microscope (TEM) equipped with a spherical aberration corrector (Cs corrector) has now become a De-facto-standard instrument in cutting-edge research sites. JEOL, up until now, has supplied […]