PEABODY, MA:  JEOL USA, a leader in developing instruments used to advance scientific research and technology, is pleased to showcase the latest updates to its core product range at Pittcon 2020. JEOL has 70 years of expertise in the field of electron microscopy, more than 60 years in mass spectrometry and NMR spectrometry, and more […]

ZEISS to expand presence in Dresden with another ZEISS Innovation Hub Oberkochen, Dresden/Germany — ZEISS has successfully concluded its acquisition of Saxonia Systems AG, a specialist for customized software solutions. The fully acquired company will now operate as Carl Zeiss Digital Innovation. In the future, the new unit Carl Zeiss Digital Innovation will further support […]

BERWYN, PA, – Researchers at the University of Texas at Austin and the National Institutes of Health created the first 3D atomic scale map of the 2019 novel coronavirus. This breakthrough will allow for the rapid development of vaccines, therapeutic antibodies, and other medical countermeasures. The researchers used AMETEK Gatan’s K3™ camera to map a […]

JEOL Ltd. (President & COO Izumi Oi) announces the release of a new atomic resolution analytical electron microscope, JEM-ARM300F2 (GRAND ARM™2) to be released in February 2020. In Electron Microscopy, a great number of microscopists and engineers have continued to pursue the improvement of resolution. Meanwhile, JEOL has made efforts to improve the stability of […]

Vironova has received the world’s first and only GMP certification for Electron Microscope Lab from Swedish Medical Products Agency (Stockholm) – Vironova AB (publ), the pioneer in empowering new biopharma drug development and quality control by using advanced electron microscopy, has received a certificate of GMP compliance of a manufacturer from the Swedish Medical Products […]

ZEISS Crossbeam Laser provides the fastest site-specific cross-section workflow by integrating a femtosecond laser, gallium ion FIB, and field emission SEM in one tool PLEASANTON, Calif., and OBERKOCHEN, Germany — ZEISS today introduced the ZEISS Crossbeam Laser – a new family of site-specific focused ion beam scanning electron microscope (FIB-SEM) solutions that accelerate package failure analysis […]

Synergizing RIKEN’s excellence in basic research in bioengineering with ZEISS’s expertise in imaging and sensing Oberkochen/Germany, Tokyo/Japan |  ZEISS Group ZEISS and RIKEN Innovation Co., Ltd. today entered into a strategic collaboration agreement to jointly explore opportunities in aiming to identify projects where the combination of RIKEN’s expertise in bioengineering and image data manipulation and […]

Peabody, Mass.   JEOL introduces a new Field Emission Scanning Electron Microscope with several features unique to the company’s FE SEM product line: NeoEngine, employing analytical intelligence for optimizing electron beam setup and tuning; embedded EDS with Live Analysis for real time imaging and elemental analysis; and Zeromag navigation function, seamlessly transitioning between optical imaging to nanoscale investigation with the high-powered […]

JEOL Ltd. (headquartered in Akishima, Tokyo; JEOL hereafter) acquired all shares of INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC. (headquartered in California, USA; IDES hereafter), an entrepreneurial venture specialized in technologies related to transmission electron microscopy (TEM hereafter), and made IDES its wholly-owned subsidiary. Background and Objective JEOL is driving continuous and sustainable growth by implementing initiatives […]

Boulder, Colo., USA: The Geological Society of America (GSA) is pleased to announce a new research grant for 2020 in partnership with The ZEISS Group, a leading international technology company in the fields of optics and optoelectronics. Together, GSA and ZEISS are offering GSA members an opportunity to apply for a new research grant of up […]