Leistungselektronik JENA GmbH signs license agreement with Carl Zeiss Microscopy GmbH

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Leistungselektronik JENA GmbH (LEJ) is proud to announce the signing of a license agreement with Carl Zeiss Microscopy GmbH. LEJ received a license to the patents US 6154282 A and CA 2280398 C relating to LED fluorescence excitation in microscopy. The license covers LEJ’s comprehensive range of LED fluorescence excitation solutions to be sold in […]

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Luxendo Announces Series A Extension Bringing Total Capital Raised to €8 Million

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Luxendo intends to use funds to drive the uptake of its Single Plane Illumination Microscopes internationally Heidelberg, Germany — Luxendo, a privately held start-up spun out of the European Molecular Biology Laboratory and developing its proprietary Single Plane Illumination Microscopy (SPIM) technology for biomedical research, announces today that the total capital raised in the Series […]

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TESCAN announces the launch of training network ELENA

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TESCAN is happy to announce the launch of the Horizon 2020 training network ELENA – Low energy ELEctron driven chemistry for the advancement of emerging NAno-fabrication methods. The project is part of the Marie Skłodowska-Curie Innovative Training Network ELENA in which young researchers investigate the chemistry and physics involved in two emerging techniques for creating […]

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Release of the JIB-4700F, a New Multi Beam System (Focused Ion Beam-Scanning Electron Microscope (FIB-SEM)) – High Resolution, High Throughput System for Nano Milling and Analysis –

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JEOL Ltd. (President Gon-emon Kurihara) announces the release of the JIB-4700F Multi Beam System, a newly-developed FIB-SEM instrument to be distributed in January 5, 2017. Product development background Advances in the development of new materials featuring complex nanostructures places increased demands on FIB-SEM instruments for exceptional resolution, accuracy and throughput. In response, JEOL has developed […]

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Release of the JXA-8530FPlus, a New Electron Probe Microanalyzer – High Throughput Analysis by the Improved Electron Optical System –

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JEOL Ltd. (President Gon-emon Kurihara) announces the release of the JXA-8530FPlus Electron Probe Microanalyzer (EPMA) equipped with the In-Lens Schottky Plus FEG (field emission gun), to be distributed in January 5, 2017. Product development background JEOL commercialized the world’s first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various […]

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