FAPS will use the FIB-SEM for silver printing and copper coating analysis in an effort to improve mechatronic systems, battery components, additive manufacturing and more. Brno, Czech Republic, and Erlangen, Germany ― TESCAN ORSAY HOLDING a.s. announces the installation of the AMBER X focused ion beam-scanning electron microscope (FIB-SEM) at the Institute for Factory Automation and Production […]

Santa Barbara, CA — Oxford Instruments Asylum Research today announced the launch of the new Cypher L atomic force microscope (AFM). Based on the acclaimed high-performance Cypher AFM platform, the Cypher L is designed for researchers who need core AFM capabilities in research markets including polymers, 2D materials, quantum technology, and energy storage. The Cypher […]

SUWON, South Korea — Park Systems, the world’s leading manufacturer of atomic force microscopes (AFM) is proud to award the Park Systems AFM Scholarship to Gen Liu at Tianjin International Center for Nanoparticles and Nanosystems (TICNN), Tianjin University, China for his research on SECCM. Scanning electrochemical cell microscope is the latest generation of scanning electrochemical microscopy technology. It is designed to […]

Chigasaki, Japan – ULVAC-PHI Incorporated has launched the PHI GENESIS, an automated and multi-function scanning X-ray photoelectron spectrometer (XPS: X-ray Photoelectron Spectroscopy or ESCA: Electron Spectroscopy for Chemical Analysis). The PHI GENESIS is the united model of PHI’s multi-functional scanning XPS instruments and was designed for automation and simplified operation. Background Advanced materials such as […]

Vironova is proud to announce the promotion of its Chief Technology Officer (CTO) Ida-Maria Sintorn to Professor of Computerized Image Processing at Uppsala University, Department of Information Technology, as of 1 July 2022. Ida-Maria has worked at Vironova since its early days in 2007. She holds a Ph.D. in image analysis from the Swedish University […]

Pursuing improved sensitivity when measuring physical properties and measurement at atomic and molecular scales Tokyo – Hitachi High-Tech Corporation (“Hitachi High-Tech”) today announced the launch of the AFM100 Pro High-Sensitivity Scanning Probe Microscope System, a high-end scanning probe microscope (AFM*1/SPM*2) equipped with a newly developed high-sensitivity optical head that improves sensitivity when measuring physical properties and […]

RALEIGH, N.C. — First launched in 2005, C-Flat has become the industry standard TEM grid within the structural biology community.  Largely driven by the rapid growth of CryoEM and Single Particle Analysis (SPA) techniques, millions of C-flat grids have been used to support samples and help identify structures including viruses and membrane proteins. “With the rapid […]

RALEIGH, N.C. — Protochips is pleased to announce the addition of two new members to the Board of Directors. Protochips has been conducting a search for the best talent and found it. Sallie Shuping Russell is an experienced investor in a diverse array of companies and institutional funds.  She has served on several technology-driven company boards across […]

Permanent installation of learning lab for K-12 classes, located within the College of Science at Northeastern University, via partnership with BioBus and ZEISS Microscopy WHITE PLAINS, N.Y.  — A class of high schoolers from Boston Green Academy cuts the ribbon on a new opportunity for students in the Greater Boston metropolitan area to experience scientific research adjacent to […]

Covalent completes installation of a new, cutting-edge JEOL JEM-F200 microscope with a cold-field-emission gun (CFEG) source and a Gatan Imaging Filter for EELS and EFTEM. Sunnyvale, CA. Covalent Metrology, a leading North-American analytical services provider, announced today that it has significantly expanded its capacity and capabilities for (Scanning) Transmission Electron Microscopy (S/TEM).  The JEM-F200 S/TEM from JEOL, […]