The Institute of Genetics and Molecular and Cellular Biology, and especially its imaging center, and Leica Microsystems marked 20 years of collaboration with a day of presentations and scientific talks highlighting the successful projects emerging from the partnership   Strasbourg. The longstanding alliance between one of Europe’s leading centres for biomedical research and the pioneering microscopy […]

Graz, Austria & Besançon, France: Following the recent launch of the Tosca™ 400 atomic force microscope, the leading scientific equipment manufacturing company Anton Paar is today announcing the launch of Tosca™ analysis software, based on Digital Surf’s Mountains® surface analysis technology. Specially designed for industrial users, the Tosca™ 400 comes with ToscaTM Control software for operating […]

Designed for the observation and inspection of metal components, the new Olympus GX53 inverted metallurgical microscope features an LED light source for ultra-long life and low power consumption. The GX53 microscope also incorporates the latest version of OLYMPUS Stream image analysis software (v. 2.3) for improved observation and reporting capabilities. Inverted metallurgical microscopes observe samples […]

Modular platform for intuitive operation, routine investigations and research applications JENA/Germany ZEISS presents the new generation of its proven high performance scanning electron microscope (SEM): The new instruments of the ZEISS EVO family come with a variety of improvements regarding usability, image quality and seamless integration into multimodal workflows. With its comprehensive range of available […]

The Grand Opening of the Park NanoScience Center at SUNY Polytechnic Institute will be held Nov. 10, 2017, at 2p.m. and will include a ribbon cutting ceremony, followed by a featured talk from Park Systems’ founder, Dr. Sang-il Park and other notable scientists and a tour of the facility. “As SUNY Polytechnic Institute provides cutting-edge educational and […]

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the Schwille Research Group at the Max Planck Institute of Biochemistry near Munich using JPK’s NanoWizard® ULTRA Speed AFM to study living membrane systems. Dr Henri Franquelim is a Post Doc researcher at the Max Planck Institute […]

Over the past decade, atomic force microscopes (AFMs) have been instrumental in understanding the nanoscale morphology of photovoltaic (PV) materials, an essential step to improving their performance. However, characterising the photoresponse of these materials with the AFM has often required a great deal of custom instrumentation development on the researcher’s part. To simplify these measurements, […]

  EDAX Granted Patent for Neighbor Pattern Averaging and Reindexing (NPAR) Routine MAHWAH, NJ – EDAX Inc., a business unit of AMETEK Materials Analysis Division, has been granted a U.S. patent for the technology that underlies its NPAR Electron Backscatter Diffraction (EBSD) routine in EDAX’s TEAM and OIM Analysis software packages. The NPAR method utilizes an […]

Contributing to the development and manufacturing of cutting edge semiconductors Tokyo, Japan —Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced that cumulative shipments of advanced Critical Dimension measurement Scanning Electron Microscopes (CD-SEMs*1) manufactured and sold by Hitachi High-Tech have exceeded 5,000 units. Since the launch in 1984, Hitachi High-Tech’s CD-SEMs have dominated the market due […]

SANTA BARBARA, California – Bruker has released the NanoMechanics Lab™, a suite of force-mapping modes that enable Dimension FastScan® and Icon® AFM systems to perform quantitative nanoscale characterization, extending from soft hydrogels and polymers to stiff metals and ceramics. The NanoMechanics Lab encompasses a broad range of nanoscale AFM measurement techniques, including the well-established Force Volume mode, as well as the new high-accuracy […]