Modular platform for intuitive operation, routine investigations and research applications JENA/Germany ZEISS presents the new generation of its proven high performance scanning electron microscope (SEM): The new instruments of the ZEISS EVO family come with a variety of improvements regarding usability, image quality and seamless integration into multimodal workflows. With its comprehensive range of available […]

The Grand Opening of the Park NanoScience Center at SUNY Polytechnic Institute will be held Nov. 10, 2017, at 2p.m. and will include a ribbon cutting ceremony, followed by a featured talk from Park Systems’ founder, Dr. Sang-il Park and other notable scientists and a tour of the facility. “As SUNY Polytechnic Institute provides cutting-edge educational and […]

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the Schwille Research Group at the Max Planck Institute of Biochemistry near Munich using JPK’s NanoWizard® ULTRA Speed AFM to study living membrane systems. Dr Henri Franquelim is a Post Doc researcher at the Max Planck Institute […]

Over the past decade, atomic force microscopes (AFMs) have been instrumental in understanding the nanoscale morphology of photovoltaic (PV) materials, an essential step to improving their performance. However, characterising the photoresponse of these materials with the AFM has often required a great deal of custom instrumentation development on the researcher’s part. To simplify these measurements, […]

  EDAX Granted Patent for Neighbor Pattern Averaging and Reindexing (NPAR) Routine MAHWAH, NJ – EDAX Inc., a business unit of AMETEK Materials Analysis Division, has been granted a U.S. patent for the technology that underlies its NPAR Electron Backscatter Diffraction (EBSD) routine in EDAX’s TEAM and OIM Analysis software packages. The NPAR method utilizes an […]

Contributing to the development and manufacturing of cutting edge semiconductors Tokyo, Japan —Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced that cumulative shipments of advanced Critical Dimension measurement Scanning Electron Microscopes (CD-SEMs*1) manufactured and sold by Hitachi High-Tech have exceeded 5,000 units. Since the launch in 1984, Hitachi High-Tech’s CD-SEMs have dominated the market due […]

SANTA BARBARA, California – Bruker has released the NanoMechanics Lab™, a suite of force-mapping modes that enable Dimension FastScan® and Icon® AFM systems to perform quantitative nanoscale characterization, extending from soft hydrogels and polymers to stiff metals and ceramics. The NanoMechanics Lab encompasses a broad range of nanoscale AFM measurement techniques, including the well-established Force Volume mode, as well as the new high-accuracy […]

ZEISS continues its strategic, global investment and growth trajectory New integrated high-tech site, which will benefit the entire region and bring together all local ZEISS units by 2023 Founding site of Jena to remain one of the top innovation hubs for ZEISS Plans to forge closer links to science, teaching and local industry The state […]

Your all-access pass to your next breakthrough. Sunnyvale, California Molecular Devices announced today the launch of the new SpectraMax® iD5 Multi-Mode Microplate Reader, a feature-rich platform that expands the boundaries of scientific research. This five-mode microplate reader with automatic filter identification and western blot capability is the complete laboratory solution to help scientists increase their […]

Laughton, United Kingdom: Quorum Technologies, market and technology leaders in electron microscopy coating and cryogenic preparation products, continue to expand their network of customer support facilities worldwide. The latest laboratory is located at Nanjing Agricultural University, China, in association with distributors, Nanjing Tansi Technology Company. Quorum’s dedication to support of their users is further emphasised […]