JEOL Ltd. (President Gon-emon Kurihara) announces the release of the JSM-7610FPlus, which is an upgraded model of the ultrahigh resolution Schottky field emission scanning electron microscope JSM-7610F, to be released in September 2017. Product development background Scanning electron microscopes are used in a wide range of fields, such as nanotechnology, metallurgy, semiconductors, ceramics, medicine, and […]

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the Skládal Research Group at Masaryk University, Brno, Czech Republic. They are studying biomolecules and cells with JPK’s NanoWizard® AFM and ForceRobot® systems as part of a development of new biosensors. Dr Jan Pribyl is Deputy Group […]

JEOL Ltd. (President Gon-emon Kurihara) is pleased to announce the “JEOL-Nikon CLEM Solution Center”, a collaborative project between Nikon and JEOL Ltd., will be established on September 1, 2017. The center will be opened in the R & D Building of JEOL to provide experience in and collect and deliver technical information on cutting-edge CLEM* […]

Woolpit, United Kingdom: Deben, a leading provider of in-situ testing stages together with innovative accessories and components for electron microscopy, has been chosen by Phenom-World to supply the Microtest Tensile Stage as an accessory to their Phenom XL range of desktop scanning electron microscopes. Phenom-World, the leading global supplier of desktop scanning electron microscopes (SEMs), […]

WINOOSKI VT, USA — As part of its continuing growth acceleration, BioTek Instruments is excited to announce the opening of the BioTek Middle East office, located in Dubai, U.A.E. The office will serve as the central hub for BioTek’s activities and growth in the Middle East and North Africa region, and will be headed by […]

Woolpit, United Kingdom: Deben, a leading provider of in-situ testing stages together with innovative accessories and components for electron microscopy, reports on the results of a new paper presented at the 2016 X-Ray Microscopy Conference where a new heating and compression stage has been developed and tested to study irradiated graphite with scientists from the […]

New analytical technologies improve workflows for life sciences and materials science researchers ST. LOUIS — Microscopy & Microanalysis  2017 – Thermo Fisher Scientific Inc., the world leader in serving science, strengthened its leadership position in electron microscopy by launching new instruments that raise the standards for performance and automation in materials science and life sciences applications at […]

XTrace, Bruker’s micro-spot X-ray source for SEM Layer analysis of PCB connector pins ST. LOUIS, Missouri – At the Microscopy & Microanalysis 2017 Meeting Bruker today presents XMethod, the world’s first software package for the analysis of composition and thickness of single or multiple layers, based on data obtained by sample excitation with the XTrace micro-focus […]

Oxford Instruments, a global leader in microanalysis systems, has introduced a real-time navigation and imaging system for the SEM that helps users interactively explore their sample based on video-rate X-ray maps coloured by element rather than just the black and white electron image alone.  Unlike traditional static approaches to elemental analysis that need the user […]

WITec’s solution for correlative Raman-SEM imaging is now available for ZEISS Sigma 300, a field emission scanning electron microscope (FE-SEM). With this jointly-developed system, WITec and ZEISS have furthered their collaboration to provide a fully-integrated instrument available as an OEM product through ZEISS that features a standard, unmodified vacuum chamber and SEM column along with […]