Graz, Austria & Besançon, France: Following the recent launch of the Tosca™ 400 atomic force microscope, the leading scientific equipment manufacturing company Anton Paar is today announcing the launch of Tosca™ analysis software, based on Digital Surf’s Mountains® surface analysis technology. Specially designed for industrial users, the Tosca™ 400 comes with ToscaTM Control software for operating […]

The Grand Opening of the Park NanoScience Center at SUNY Polytechnic Institute will be held Nov. 10, 2017, at 2p.m. and will include a ribbon cutting ceremony, followed by a featured talk from Park Systems’ founder, Dr. Sang-il Park and other notable scientists and a tour of the facility. “As SUNY Polytechnic Institute provides cutting-edge educational and […]

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the Schwille Research Group at the Max Planck Institute of Biochemistry near Munich using JPK’s NanoWizard® ULTRA Speed AFM to study living membrane systems. Dr Henri Franquelim is a Post Doc researcher at the Max Planck Institute […]

Over the past decade, atomic force microscopes (AFMs) have been instrumental in understanding the nanoscale morphology of photovoltaic (PV) materials, an essential step to improving their performance. However, characterising the photoresponse of these materials with the AFM has often required a great deal of custom instrumentation development on the researcher’s part. To simplify these measurements, […]

SANTA BARBARA, California – Bruker has released the NanoMechanics Lab™, a suite of force-mapping modes that enable Dimension FastScan® and Icon® AFM systems to perform quantitative nanoscale characterization, extending from soft hydrogels and polymers to stiff metals and ceramics. The NanoMechanics Lab encompasses a broad range of nanoscale AFM measurement techniques, including the well-established Force Volume mode, as well as the new high-accuracy […]

NT-MDT SI announces the termination of its employment agreement with Mr. Dmitry Kozodaev, our European regional sales manager, effective from April 1st 2017. We would like to thank Mr. Dmitry Kozodaev for his service over the past 10 years and wish him good luck with his recently developed company. NT-MDT SI does not take any […]

HORIBA CLUE Series offer a scalable platform for imaging and spectroscopic analysis of nano-objects with SEM and dual SEM/FIB (Focused Ion Beam) microscopes. HORIBA Scientific, global leader in spectroscopic analysis for over 40 years, is proud to announce the new HORIBA CLUE Series detectors for Scanning Electron Microscopes (SEM). HORIBA CLUE Series include: i-CLUE fast […]

Oxford Instruments NanoScience announces the long-term collaboration agreement signed with CASmF Science and Technology Limited (CASmF) in China, to jointly develop high precision Scanning Probe Microscope (SPM) products using TeslatronPT, the Cryofree® superconducting magnet system from Oxford Instruments. SPM products form images of surfaces using a physical probe that scans the specimen. The SPM probe when used with TestatronPT can be […]

The atomic force microscope ToscaTM 400 by Anton Paar is available for sale now. This high-end product measures nano-surface properties and was specially designed for industrial users. Thanks to the automation on every level of operation, ToscaTM 400 is easy to handle. Until now atomic force microscopes were complex and rather complicate to operate thus they were – and […]

JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, reports on the Skládal Research Group at Masaryk University, Brno, Czech Republic. They are studying biomolecules and cells with JPK’s NanoWizard® AFM and ForceRobot® systems as part of a development of new biosensors. Dr Jan Pribyl is Deputy Group […]