XTrace, Bruker’s micro-spot X-ray source for SEM Layer analysis of PCB connector pins ST. LOUIS, Missouri – At the Microscopy & Microanalysis 2017 Meeting Bruker today presents XMethod, the world’s first software package for the analysis of composition and thickness of single or multiple layers, based on data obtained by sample excitation with the XTrace micro-focus […]

Oxford Instruments, a global leader in microanalysis systems, has introduced a real-time navigation and imaging system for the SEM that helps users interactively explore their sample based on video-rate X-ray maps coloured by element rather than just the black and white electron image alone.  Unlike traditional static approaches to elemental analysis that need the user […]

New instrument enables non-destructive evaluation of the distribution of nanoparticles or nanopores by size August 1, 2017 – Tokyo, Japan. X-ray scientific, analytical and industrial instrumentation manufacturer Rigaku Corporation, has announced the NANOPIX mini, the world’s first benchtop small angle X-ray scattering (SAXS) system that delivers automatic nanoparticle size distribution analysis for both quality control […]

SPECTRO Analytical Instruments today introduced the SPECTRO MIDEX MID05 spectrometer — a fifth-generation, fast, accurate, small-spot energy-dispersive X-ray fluorescence (ED-XRF) analyzer for precious metal testing. The new, compact SPECTRO MIDEX MID05 spectrometer delivers improved sensitivity and speed, and represents a smart alternative to fire assay testing. Incorporating the latest developments in ED-XRF detector technology using […]

Judges Scientific announces that its majority owned subsidiary Bordeaux Acquisition Limited (“Bordeaux”) has today acquired Oxford Cryosystems Ltd, the global leader in cryogenic devices for X-ray crystallography research. Oxford Cryosystems specialises in the design and manufacture of devices used to cryogenically cool crystalline samples during X-ray crystallography experiments, allowing users to investigate the structure of […]

Almelo, the Netherlands Focus on the details to capture the bigger picture. PANalytical, world’s leading supplier of analytical X-ray instrumentation, software and expertise, announces the introduction of a new Epsilon 1 X-ray fluorescence (XRF) spectrometer. This new member of the Epsilon 1 family has been designed for small spot analysis, and is the most powerful […]

PANalytical has appointed Aimil Ltd. as the authorized representative for ASD nearinfrared products in India BOULDER, Colo. – ASD Inc., a PANalytical company, a global leader in high-performance analytical instrumentation and materials analysis solutions, today announced a partnership with Aimil Ltd., the leading provider of state-of-the-art instruments and related services, to distribute several ASD products […]

In March 2017, at the Almalyk Mining and Metallurgical completed commissioning of the X-ray wavelength dispersive flowstream pulp analyzer AP-35-A manufactured by Bourevestnik Inc. The instrument installed within the frames of “Involvement of off-balance dump mines of the «Kalmakyr» deposit. A special feature of this project is a comprehensive replacement of the outdated analyzer AR-31, […]