Advanced semiconductor circuit edit system enables customers to quickly resolve preproduction design flaws and maintain device integrity and function Hillsboro, Ore., Feb. 16, 2021—Thermo Fisher Scientific Inc., the world leader in serving science, today introduced the Thermo Scientific Centrios HX Circuit Edit System. This state-of-the-art circuit edit solution allows semiconductor manufacturers to optimize success rates with […]

MAHWAH, NJ – EDAX, LLC, a leader in X-ray microanalysis and electron diffraction instrumentation, has added the Clarity™ Super to its Electron Backscatter Diffraction (EBSD) product line. The Clarity EBSD Detector Series is the first commercially available direct detector system designed for EBSD applications. The series includes the original Clarity, now called the Clarity Plus, […]

Founded in 2019, ELDICO Scientific embarked on an ambitious journey: The company wants to make electron diffraction, a promising analytical technique for nano-scale research, easy and accessible to the industry and academia. This February, ELDICO is about to put its first dedicated electron diffractometer into operation at Europe’s first electron diffraction platform hosted by the Switzerland Innovation Park […]

Founded in 2019, ELDICO Scientific embarked on an ambitious journey: The company wants to make electron diffraction, a promising analytical technique for nano-scale research, easy and accessible to the industry and academia. This February, ELDICO is about to put its first dedicated electron diffractometer into operation at Europe’s first electron diffraction platform hosted by the Switzerland Innovation Park […]

LEHIGH ACRES, Fla. — EXpressLO LLC is the most comprehensive provider of focused ion beam (FIB) ex situ lift out (EXLO) specimen preparation solutions for transmission electron microscopy (EM) and other analytical techniques. As of January 27, 2022, EXpressLO LLC submitted a patent application to the U.S. Patent and Trademark Office describing highly innovative methods and apparatus for […]

ZEISS introduces an integrated solution for multi-modal in situ experiments Automated in situ workflows for highly reproducible, precise, and reliable operator-independent data collection High-throughput data acquisition with high-resolution creating statistically representative results High-quality data for reliable post-processing, such as strain mapping using digital imaging correlation (DIC), powered by GOM Easy data management Jena, Germany | […]

~ STEM education project gives students unique opportunity to experience scientific research ~ A new STEM outreach project saw 2,300 students from 25 schools given the chance to use high-level scientific instruments to carry out their own experiments. Leading manufacturer of scientific equipment, Oxford Instruments, contributed to the project, providing an AZtecLive One Xplore energy […]

(Peabody, MA) – A new Scanning Electron Microscope (SEM) from JEOL answers the need for faster and easier acquisition of both SEM images and EDS data analysis, especially suited for repetitive operations and quality control. JEOL, the global leader in the development of cutting-edge Electron Microscopes for materials characterization and analysis, introduces its latest SEM, the […]

New FE-LEEM P90 AC system installed at Harvard University in Cambridge, MA A new low energy electron microscope with integrated aberration correction system (FE-LEEM P90 AC) has been installed at the Center for Nanaoscale Systems within Harvard University (USA), in the research group of Professor David C. Bell of the Harvard John A. Paulson School of Engineering […]

The Carl Zeiss AG shareholders’ meeting has appointed Dr. Michael Bolle the new Supervisory Board member to represent the sole shareholder the Carl Zeiss Foundation. He will be elected Chairman of the Supervisory Board of Carl Zeiss AG in January 2022. Dr. Bolle will succeed Dr. Dieter Kurz, whose mandate as Chairman of the Supervisory […]