MAHWAH, NJ –EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation has added a new, faster, low-noise CMOS camera to its Velocity™ EBSD Camera Series. The Velocity™ Super is currently the fastest EBSD camera in the world, offering high-speed EBSD mapping with the highest indexing performance on real-world materials. The Velocity™ EBSD Camera […]

Pittcon 2019 – Philadelphia, PA JEOL USA introduces our 4th generation benchtop Scanning Electron Microscope (SEM) that delivers many powerful features of a full-sized SEM in a small package. The new JEOL NeoScope™ (model JCM-7000) will be demonstrated in booth #3035 at Pittcon 2019 in Philadelphia. This benchtop SEM’s advanced technology and functions make it […]

JEOL Ltd. (President Gon-emon Kurihara) announces the release of a new benchtop scanning electron microscope (SEM), the JCM-7000 series NeoScope™, to be released in March 2019. Product development background Benchtop scanning electron microscopes are used in a wide range of fields, such as electrical, electronics, automobiles, machinery, chemical, and pharmaceutical industries. In addition, SEM applications […]

Making materials laboratories more productive JENA/Germany ZEISS ZEN core is a powerful software suite for microscopy imaging, automated analyses, and multi-modal workflows in connected materials laboratory environments. With the new release, materials researchers are now even more efficient. ZEISS ZEN core is not only used as a powerful tool for image analysis and interactive control […]

Sydney, Australia – AXT and QUT (Queensland University of Technology) are pleased to announce that QUT have just ordered a TESCAN S8000X Xe plasma FIB-SEM. The S8000X is a next-generation FIB-SEM that offers unrivalled versatility, ultra-high-resolution imaging and high-speed nanomachining capabilities. It will be one of the flagship instruments at QUT’s Central Analytical Research Facility (CARF) […]

The Max Planck Florida Institute for Neuroscience (MPFI) announces a new “labs@location” partnership agreement between the MPFI Electron Microscopy (EM) Core Facility and Germany-based microscopy company ZEISS, known for its cutting-edge imaging technologies. As a “labs@location” partner institution, MPFI will have access to state-of-the-art ZEISS technology before it is commercially available, providing researchers with innovative […]

Tokyo, Japan – Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced that on January 15, 2019 Hitachi High-Tech acquired all issued shares of Applied Physics Technologies, Inc. (Head Office: Oregon, U.S.A.; Representative: William Mackie, APTech), which develops, manufactures and sells electron sources for use in electron microscopes and other instruments. Following the acquisition of all […]

Newly established Electron Microscopy Laboratory is now part of our Faculty. Laboratory is equipped with new JEOL JEM-NEOARM 200Ftransmission electron microscope. Microscope is able to image: ·         Structure of zeolites and zeolitic materials ·         Metal-organic frameworks (MOFs) structures ·         Carbon nanomaterials ·         Polymer nanoparticles ·         Self-assembly supramolecular structures (micelles, vesicles) ·         …and many more!   […]

Revenue increased by nine percent to EUR 5.8 billion Semiconductor Manufacturing Technology and Medical Technology drove growth All segments and regions contributed to positive result Research and development expenditures have paid off Revenue increased by 12 percent after currency adjustments STUTTGART/Germany The ZEISS Group is continuing its growth trajectory. In fiscal year 2017/18 (ended on […]

JEOL Ltd. (President Gon-emon Kurihara) announces the release of a new high throughput analytical electron microscope, JEM-ACE200F, to be released in December 2018. Product development background Along with further miniaturization of devices in the recent semiconductor industry, the transmission electron microscope (TEM) has become an essential tool for various applications of device characterization. These applications […]