Sydney, Australia – AXT and QUT (Queensland University of Technology) are pleased to announce that QUT have just ordered a TESCAN S8000X Xe plasma FIB-SEM. The S8000X is a next-generation FIB-SEM that offers unrivalled versatility, ultra-high-resolution imaging and high-speed nanomachining capabilities. It will be one of the flagship instruments at QUT’s Central Analytical Research Facility (CARF) […]

The Max Planck Florida Institute for Neuroscience (MPFI) announces a new “labs@location” partnership agreement between the MPFI Electron Microscopy (EM) Core Facility and Germany-based microscopy company ZEISS, known for its cutting-edge imaging technologies. As a “labs@location” partner institution, MPFI will have access to state-of-the-art ZEISS technology before it is commercially available, providing researchers with innovative […]

Tokyo, Japan – Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced that on January 15, 2019 Hitachi High-Tech acquired all issued shares of Applied Physics Technologies, Inc. (Head Office: Oregon, U.S.A.; Representative: William Mackie, APTech), which develops, manufactures and sells electron sources for use in electron microscopes and other instruments. Following the acquisition of all […]

Newly established Electron Microscopy Laboratory is now part of our Faculty. Laboratory is equipped with new JEOL JEM-NEOARM 200Ftransmission electron microscope. Microscope is able to image: ·         Structure of zeolites and zeolitic materials ·         Metal-organic frameworks (MOFs) structures ·         Carbon nanomaterials ·         Polymer nanoparticles ·         Self-assembly supramolecular structures (micelles, vesicles) ·         …and many more!   […]

Revenue increased by nine percent to EUR 5.8 billion Semiconductor Manufacturing Technology and Medical Technology drove growth All segments and regions contributed to positive result Research and development expenditures have paid off Revenue increased by 12 percent after currency adjustments STUTTGART/Germany The ZEISS Group is continuing its growth trajectory. In fiscal year 2017/18 (ended on […]

JEOL Ltd. (President Gon-emon Kurihara) announces the release of a new high throughput analytical electron microscope, JEM-ACE200F, to be released in December 2018. Product development background Along with further miniaturization of devices in the recent semiconductor industry, the transmission electron microscope (TEM) has become an essential tool for various applications of device characterization. These applications […]

TOKYO, Japan – Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has announced its newest MASK MVM-SEM (Multi Vision Metrology Scanning Electron Microscope), the E3650.Using Advantest’s proprietary electron beam scanning technology, the new tool measures fine pattern dimensions on photomasks with higher precision and stability. The E3650 is the newest entry in the company’s […]

Besançon, France & Hørsholm, Denmark: Since SPM specialists Image Metrology and Digital Surf joined forces in 2014, development teams from both companies have been working hard to create the next generation of SPM image analysis software. The new product line, named MountainsSPIP 8™, will be unveiled at the MRS Fall Exhibit in Boston on November 27-29, 2018 and […]

JENA/Germany, CAPE TOWN/South Africa ZEISS today announces its biggest new release of the ZEISS Mineralogic software at the Process Mineralogy ’18 conference in Cape Town, South Africa. This is the 7th instalment of ZEISS Mineralogic since the software was brought to the market in July 2014 and represents a significant advancement in both features and […]

Woolpit, United Kingdom: Deben, a leading provider of in-situ testing stages together with innovative accessories and components for electron microscopy, reports on how Scale Protection have used their SEM motorised XY stage in a Hitachi Benchtop SEM continuously for the past four years for the analysis of particulates collected on filters from water extracted from […]