HILLSBORO, Ore. — Scientists, engineers and researchers can now instantly view and analyze meaningful elemental content that is differentiated by color directly from a scanning electron microscope (SEM). The Thermo Scientific ColorSEM technology is the first commercial solution that includes integrated elemental analysis with unique color imaging. It produces live color images directly within the simplified SEM user […]

In 2017 Stellenbosch University, South Africa undertook an experimental campaign which focused on analysing venomous snake fangs. The motivation behind the campaign was to understand in detail the internal and external morphology and mechanical properties of snake fangs. The study focused on comparing the maximum Von Mises stress values when a load was applied to […]

The comprehensive offering from Thermo Fisher can improve outcomes in materials and life sciences research HILLSBORO, Ore. — Researchers and scientists analyzing crystallized protein samples in life sciences and materials research can now benefit from the first commercially released integrated solution for performing micro electron diffraction (MicroED), an advanced technique that enables researchers to quickly resolve […]

— Featuring a large specimen chamber and advanced functionalities — Tokyo, Japan—Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced today that it will commence sales of the SU3800 and the oversized SU3900 scanning electron microscopes (SEMs) featuring the ability to accommodate large, heavy specimens, along with advanced functionalities for automated measurement and wide-angle camera navigation. […]

MAHWAH, NJ –EDAX, Inc., a leader in X-ray microanalysis and electron diffraction instrumentation has added a new, faster, low-noise CMOS camera to its Velocity™ EBSD Camera Series. The Velocity™ Super is currently the fastest EBSD camera in the world, offering high-speed EBSD mapping with the highest indexing performance on real-world materials. The Velocity™ EBSD Camera […]

Pittcon 2019 – Philadelphia, PA JEOL USA introduces our 4th generation benchtop Scanning Electron Microscope (SEM) that delivers many powerful features of a full-sized SEM in a small package. The new JEOL NeoScope™ (model JCM-7000) will be demonstrated in booth #3035 at Pittcon 2019 in Philadelphia. This benchtop SEM’s advanced technology and functions make it […]

JEOL Ltd. (President Gon-emon Kurihara) announces the release of a new benchtop scanning electron microscope (SEM), the JCM-7000 series NeoScope™, to be released in March 2019. Product development background Benchtop scanning electron microscopes are used in a wide range of fields, such as electrical, electronics, automobiles, machinery, chemical, and pharmaceutical industries. In addition, SEM applications […]

Making materials laboratories more productive JENA/Germany ZEISS ZEN core is a powerful software suite for microscopy imaging, automated analyses, and multi-modal workflows in connected materials laboratory environments. With the new release, materials researchers are now even more efficient. ZEISS ZEN core is not only used as a powerful tool for image analysis and interactive control […]

Sydney, Australia – AXT and QUT (Queensland University of Technology) are pleased to announce that QUT have just ordered a TESCAN S8000X Xe plasma FIB-SEM. The S8000X is a next-generation FIB-SEM that offers unrivalled versatility, ultra-high-resolution imaging and high-speed nanomachining capabilities. It will be one of the flagship instruments at QUT’s Central Analytical Research Facility (CARF) […]

The Max Planck Florida Institute for Neuroscience (MPFI) announces a new “labs@location” partnership agreement between the MPFI Electron Microscopy (EM) Core Facility and Germany-based microscopy company ZEISS, known for its cutting-edge imaging technologies. As a “labs@location” partner institution, MPFI will have access to state-of-the-art ZEISS technology before it is commercially available, providing researchers with innovative […]