Thuwal, Kingdom of Saudi Arabia: King Abdullah University of Science and Technology (KAUST) and Thermo Fisher Scientific Inc. held an opening ceremony on May 9 for the Electron Microscopy Center of Excellence at the KAUST campus in Thuwal, Saudi Arabia. This new center builds upon the long-standing partnership between KAUST and Thermo Fisher, and will […]

Plasma FIB addition to flagship DualBeam can significantly increase milling speed, enabling analyses of larger features that are impractical with conventional FIB technology HILLSBORO, ORE – The flagship FEI Helios G4 DualBeam Series is now available with plasma focused ion beam (PFIB) technology for advanced materials research. The faster milling capability of the PFIB enables the […]

Lab infrastructure solution ZEISS ZEN 2 core is connecting systems, data and workflows JENA/Germany, STUTTGART/Germany At this year’s Control trade show from 9th to 12th May, ZEISS is presenting a networked lab for quality control and quality assurance. Connected systems, data and workflows enable more efficient collaboration – even across lab boundaries. With the new […]

Woolpit, United Kingdom: Deben, a leading provider of in-situ testing stages together with innovative accessories and components for electron microscopy, reports on how the Marrow group in the Materials Department at the University of Oxford applies Deben’s mechanical stage for in situ µXCT studies of multiple engineering and natural materials. Professor James Marrow leads a […]

Overview:                    The Thermo Scientific Explorer 4 Analyzer with MQA software now offers improved throughput for analysis of non-metallic inclusions in steel. The platform is a fourth-generation scanning electron microscope (SEM)/x-ray spectroscopy (EDX) for industrial manufacturing. It is faster and easier to use than its predecessors, yet still maintains its predecessors’ industry-standard accuracy and reliability. Key […]

JEOL Ltd. (President Gon-emon Kurihara) announces the release of a new field-emission cryo-electron microscope, the JEM-Z200FSC (CRYO ARM™ 200), to be released in April 2017. Product development background Cryo-electron microscopy has been established as a method to enable observation of cells and biological molecules with no fixation and no staining. Owing to the recent rapid […]

Experience correlative and advanced 3D microscopy OBERKOCHEN/Germany On 24 April 2017 ZEISS opened the new ZEISS Microscopy Customer Center Europe at the Oberkochen site. This is the most comprehensive ZEISS Customer Center including light, electron and X-ray microscopy in a single location: here users from Industry and Academia can try out correlative workflows between the […]

(Peabody, Mass.) JEOL, a global leader in scanning electron microscopy (SEM) for imaging and analysis, will exhibit its popular InTouchScope series SEM at Ceramics Expo in Cleveland, OH on April 25-27.   From surface observation to cross-section imaging and analysis, JEOL Scanning Electron Microscopes and ion beam polishers reveal structural and elemental details to ensure […]

BUFFALO GROVE, Ill. — Leica Microsystems, a technology leader with a 160-year history of providing best-in-class precision microscopy, electron microscopy (EM) sample preparation and digital micro-imaging solutions, announces a strategic expansion in its market representation in the Midwest and Western regions of the United States. NCI Inc. (formerly North Central Instruments) of Brooklyn Park, Minnesota, will be […]