New partnership strengthens global sales activities for unique ZEISS ORION NanoFab platform The Microscopy business group of ZEISS and the Raith Group agreed to unite their sales and promotional activities for ZEISS ORION NanoFab, the only helium-ion-microscope in the world. ORION NanoFab fabricates sub-10 nm structures and images at 0.5 nm. Combined with a focused […]

Thermo Fisher Scientific’s Cryo-TEM provides critical information for small molecule and biologic drug discovery HILLSBORO, ORE – A new contract research laboratory operated by France-based NovAliX will provide pharmaceutical companies with access to high-resolution cryo-transmission electron microscopy (cryo-TEM) by Thermo Fisher Scientific for facilitating small molecule and biologic drug discovery. NovAliX’s new laboratory will use the […]

Laughton, United Kingdom, 31st January 2017: Quorum Technologies, market and technology leaders in electron microscopy coating and cryogenic preparation products, report on how their PP3010T Cryo-SEM preparation system is being used in the preparation of hydrated whole cells to be imaged using electron cryotomography in the Jensen Laboratory located at HHMI Caltech. Alasdair McDowall is […]

ACQUISITION STRENGTHENS BRUKER’S LEADING POSITION IN NANOANALYSIS AND NANOMECHANICAL MATERIALS CHARACTERIZATION BILLERICA, Mass. — Bruker today announced that it has acquired Hysitron, Inc., a technology leader in the development, manufacture, and sale of nanomechanical test instrumentation. The acquisition adds Hysitron’s innovative nanomechanical testing instruments to Bruker’s existing portfolio of atomic force microscopes (AFMs), surface profilometers, and tribology and mechanical testing […]

TESCAN is happy to announce the launch of the Horizon 2020 training network ELENA – Low energy ELEctron driven chemistry for the advancement of emerging NAno-fabrication methods. The project is part of the Marie Skłodowska-Curie Innovative Training Network ELENA in which young researchers investigate the chemistry and physics involved in two emerging techniques for creating […]

JEOL Ltd. (President Gon-emon Kurihara) announces the release of the JIB-4700F Multi Beam System, a newly-developed FIB-SEM instrument to be distributed in January 5, 2017. Product development background Advances in the development of new materials featuring complex nanostructures places increased demands on FIB-SEM instruments for exceptional resolution, accuracy and throughput. In response, JEOL has developed […]