The DM6 M LIBS 2-in-1 microscope comes with integrated chemical analysis The new DM6 M LIBS microscope for materials analysis from Leica Microsystems allows you to analyze the 2 main characteristics of a material in 1 work step, i.e., microstructure and composition. The microscope has an integrated laser spectroscopy (LIBS) function and delivers the chemical composition of […]

Addressing the highest demands in imaging and analytics from any sample JENA/Germany ZEISS introduces its new field emission scanning electron microscope (FE-SEM) ZEISS GeminiSEM 450. The instrument combines ultrahigh resolution imaging with the capability to perform advanced analytics while maintaining flexibility and ease-of-use. With ZEISS GeminiSEM 450, users benefit from high resolution, surface sensitive imaging […]

CSSB and Leica Microsystems establish an Advanced light and Fluorescence Microscopy (ALFM) facility and integrated Cryo-Imaging solutions Hamburg. Leica Microsystems are pleased to announce a new collaboration with the Centre for Structural Systems Biology (CSSB). The partnership, being announced to coincide with the Opening Symposium of the CSSB, will see major collaboration between the two […]

High resolution 3D block face imaging for biological samples with fast acquisition rates and minimal sample damage JENA/Germany; SAN DIEGO/USA In collaboration with the National Center for Microscopy and Imaging Research (NCMIR) at the University of California San Diego, ZEISS releases a new Focal Charge Compensation module for block face imaging with ZEISS GeminiSEM and […]

Laughton, United Kingdom: Quorum Technologies, market and technology leaders in electron microscopy coating and cryogenic preparation products, report on how the Laboratory of Food Technology & Engineering at the University of Ghent, Belgium, applies cryo techniques to prepare food samples for study by scanning electron microscopy. Ir Davy Van de Walle is a senior researcher […]

Modular platform for intuitive operation, routine investigations and research applications JENA/Germany ZEISS presents the new generation of its proven high performance scanning electron microscope (SEM): The new instruments of the ZEISS EVO family come with a variety of improvements regarding usability, image quality and seamless integration into multimodal workflows. With its comprehensive range of available […]

  EDAX Granted Patent for Neighbor Pattern Averaging and Reindexing (NPAR) Routine MAHWAH, NJ – EDAX Inc., a business unit of AMETEK Materials Analysis Division, has been granted a U.S. patent for the technology that underlies its NPAR Electron Backscatter Diffraction (EBSD) routine in EDAX’s TEAM and OIM Analysis software packages. The NPAR method utilizes an […]

Contributing to the development and manufacturing of cutting edge semiconductors Tokyo, Japan —Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced that cumulative shipments of advanced Critical Dimension measurement Scanning Electron Microscopes (CD-SEMs*1) manufactured and sold by Hitachi High-Tech have exceeded 5,000 units. Since the launch in 1984, Hitachi High-Tech’s CD-SEMs have dominated the market due […]

ZEISS continues its strategic, global investment and growth trajectory New integrated high-tech site, which will benefit the entire region and bring together all local ZEISS units by 2023 Founding site of Jena to remain one of the top innovation hubs for ZEISS Plans to forge closer links to science, teaching and local industry The state […]

Laughton, United Kingdom: Quorum Technologies, market and technology leaders in electron microscopy coating and cryogenic preparation products, continue to expand their network of customer support facilities worldwide. The latest laboratory is located at Nanjing Agricultural University, China, in association with distributors, Nanjing Tansi Technology Company. Quorum’s dedication to support of their users is further emphasised […]