Release of a New Ultrahigh Atomic Resolution Analytical Electron Microscope JEM-ARM300F2 (GRAND ARM™2)

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JEOL Ltd. (President & COO Izumi Oi) announces the release of a new atomic resolution analytical electron microscope, JEM-ARM300F2 (GRAND ARM™2) to be released in February 2020. In Electron Microscopy, a great number of microscopists and engineers have continued to pursue the improvement of resolution. Meanwhile, JEOL has made efforts to improve the stability of […]

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The world’s first GMP certification for Electron Microscope Lab

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Vironova has received the world’s first and only GMP certification for Electron Microscope Lab from Swedish Medical Products Agency (Stockholm) – Vironova AB (publ), the pioneer in empowering new biopharma drug development and quality control by using advanced electron microscopy, has received a certificate of GMP compliance of a manufacturer from the Swedish Medical Products […]

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ZEISS Accelerates Semiconductor Package Failure Analysis by Orders of Magnitude with Crossbeam Laser FIB-SEM

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ZEISS Crossbeam Laser provides the fastest site-specific cross-section workflow by integrating a femtosecond laser, gallium ion FIB, and field emission SEM in one tool PLEASANTON, Calif., and OBERKOCHEN, Germany — ZEISS today introduced the ZEISS Crossbeam Laser – a new family of site-specific focused ion beam scanning electron microscope (FIB-SEM) solutions that accelerate package failure analysis […]

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ZEISS and RIKEN Innovation establish partnership in bioengineering and data management

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Synergizing RIKEN’s excellence in basic research in bioengineering with ZEISS’s expertise in imaging and sensing Oberkochen/Germany, Tokyo/Japan |  ZEISS Group ZEISS and RIKEN Innovation Co., Ltd. today entered into a strategic collaboration agreement to jointly explore opportunities in aiming to identify projects where the combination of RIKEN’s expertise in bioengineering and image data manipulation and […]

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JEOL Introduces New Field Emission SEM With Automated Analytical Intelligence

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Peabody, Mass.   JEOL introduces a new Field Emission Scanning Electron Microscope with several features unique to the company’s FE SEM product line: NeoEngine, employing analytical intelligence for optimizing electron beam setup and tuning; embedded EDS with Live Analysis for real time imaging and elemental analysis; and Zeromag navigation function, seamlessly transitioning between optical imaging to nanoscale investigation with the high-powered […]

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Acquisition of INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC.

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JEOL Ltd. (headquartered in Akishima, Tokyo; JEOL hereafter) acquired all shares of INTEGRATED DYNAMIC ELECTRON SOLUTIONS, INC. (headquartered in California, USA; IDES hereafter), an entrepreneurial venture specialized in technologies related to transmission electron microscopy (TEM hereafter), and made IDES its wholly-owned subsidiary. Background and Objective JEOL is driving continuous and sustainable growth by implementing initiatives […]

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Lasertec releases OPTELICS HYBRID+ confocal laser scanning microscope

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Yokohama, Japan – Lasertec Corporation today announced the release of OPTELICS HYBRID+, the latest model of OPTELICS HYBRID series confocal laser scanning microscope that combines two sets of optics – laser confocal and white light confocal – for the pursuit of high performance and multi-functions. OPTELICS HYBRID+ will be presented to ELECTROTEST JAPAN from January […]

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New Product: Hybrid confocal laser scanning microscope “OPTELICS® HYBRID+”

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Lasertec Corporation today announced the release of OPTELICS® HYBRID+, the latest model of OPTELICS® HYBRID series confocal laser scanning microscope that combines two sets of optics – laser confocal and white light confocal – for the pursuit of high performance and multi-functions. OPTELICS® HYBRID+ will be presented to ELECTROTEST JAPAN from January 15, 2020 at Tokyo […]

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