Woolpit, United Kingdom: Deben, a leading provider of in-situ testing stages together with innovative accessories and components for electron microscopy, has been chosen by Phenom-World to supply the Microtest Tensile Stage as an accessory to their Phenom XL range of desktop scanning electron microscopes. Phenom-World, the leading global supplier of desktop scanning electron microscopes (SEMs), […]

WINOOSKI VT, USA — As part of its continuing growth acceleration, BioTek Instruments is excited to announce the opening of the BioTek Middle East office, located in Dubai, U.A.E. The office will serve as the central hub for BioTek’s activities and growth in the Middle East and North Africa region, and will be headed by […]

Woolpit, United Kingdom: Deben, a leading provider of in-situ testing stages together with innovative accessories and components for electron microscopy, reports on the results of a new paper presented at the 2016 X-Ray Microscopy Conference where a new heating and compression stage has been developed and tested to study irradiated graphite with scientists from the […]

New analytical technologies improve workflows for life sciences and materials science researchers ST. LOUIS — Microscopy & Microanalysis  2017 – Thermo Fisher Scientific Inc., the world leader in serving science, strengthened its leadership position in electron microscopy by launching new instruments that raise the standards for performance and automation in materials science and life sciences applications at […]

XTrace, Bruker’s micro-spot X-ray source for SEM Layer analysis of PCB connector pins ST. LOUIS, Missouri – At the Microscopy & Microanalysis 2017 Meeting Bruker today presents XMethod, the world’s first software package for the analysis of composition and thickness of single or multiple layers, based on data obtained by sample excitation with the XTrace micro-focus […]

Oxford Instruments, a global leader in microanalysis systems, has introduced a real-time navigation and imaging system for the SEM that helps users interactively explore their sample based on video-rate X-ray maps coloured by element rather than just the black and white electron image alone.  Unlike traditional static approaches to elemental analysis that need the user […]

WITec’s solution for correlative Raman-SEM imaging is now available for ZEISS Sigma 300, a field emission scanning electron microscope (FE-SEM). With this jointly-developed system, WITec and ZEISS have furthered their collaboration to provide a fully-integrated instrument available as an OEM product through ZEISS that features a standard, unmodified vacuum chamber and SEM column along with […]

Combined Solution Accelerates Electron Microscopy Workflows with Next-Generation, High-Resolution Cameras and Best-In-Class, High-Performance Data Storage SANTA CLARA, Calif. — DataDirect Networks (DDN®) today announced a strategic partnership with Gatan®, the world’s leading manufacturer of instrumentation and software used to enhance and extend the operation and performance of electron microscopes, to deliver groundbreaking solutions for microscopy research environments […]

New Thermo Scientific Aquilos FIB/SEM protects sample integrity and enhances productivity for cryo-electron tomography workflow ST. LOUIS — Microscopy & Microanalysis 2017 – The new Thermo Scientific Aquilos is the first commercial cryo-DualBeam (focused ion beam/scanning electron microscope) system dedicated to the preparation of frozen, thin lamella samples from biological specimens for high-resolution tomographic imaging in a […]

New Thermo Scientific Krios G3i raises bar for performance, automation and time-to-results Breakthrough Thermo Scientific Glacios provides a cryo-EM entry path for a broader range of researchers   ST. LOUIS — Microscopy & Microanalysis 2017 — Thermo Fisher Scientific, the world leader in serving science, has extended its leadership in cryo-electron microscopy (cryo-EM) with the introduction of […]