TOKYO – Evolution of Integrated EPMA – JEOL Ltd. (6951.T) (President & COO Izumi Oi) announces the release of a new Schottky field emission Electron Probe Microanalyzer JXA-iHP200F and a new tungsten/LaB6 Electron Probe Microanalyzer JXA-iSP100, to be released in November 2019. Product Development Background Electron Probe Microanalyzers (EPMAs) are used as tools for research & […]
Next-generation, cost-effective solution for front- and back-side edits enables rapid prototyping PORTLAND, Ore. — Circuit edit (CE) engineers, whether supporting designers or in service labs, who are looking for a cost-effective solution can increase their productivity with the next-generation Thermo Scientific Centrios circuit edit system. Announced today at the International Symposium for Testing and Failure Analysis (ISTFA) […]
Hitachi High-Technologies Corporation (TSE:8036/Hitachi High-Tech) have undertaken a third-party allotment of shares (this capital alliance) with Vironova AB (Main office: Stockholm, Sweden /CEO: Mohammed Homman/Vironova), who develop and sell analysis software for transmission electron microscopes (TEM) along with carrying out contract analysis for pharmaceutical companies. Through this capital alliance, we aim to jointly develop TEM […]
Latest DualBeam system provides significant clarity of protein interactions HILLSBORO, Ore. — Thermo Fisher Scientific today announced the Thermo Scientific Aquilos 2 Cryo-FIB, a DualBeam system dedicated to the preparation of thin, electron-transparent samples from biological specimens. It simplifies the cryo-electron tomography (cryo-ET) workflow by reducing sample preparation time, minimizing the risk of contamination and providing a […]
New ZEISS iCeMS Innovation Core collaborative laboratory opened Jena, Germany, Kyoto, Japan | ZEISS and Kyoto University are intensifying their cooperation and have signed a new strategic research agreement. As part of the agreement, the partners are opening the ZEISS iCeMS Innovation Core – a collaborative laboratory at Kyoto University’s Institute for Integrated Cell-Material Sciences […]
Rate non-metallic inclusions rapidly and reliably Leica Microsystems launches the new LAS X Steel Expert software for fast and accurate rating of non-metallic inclusions in steel. The LAS X Steel Expert is used in combination with a Leica microscope to ensure steel quality compliance with international, regional and organizational standards, such as ISO 4967, EN 10247, ASTM E45, DIN […]
Offering High-Performance Solutions for Industrial and Material Applications Leica Microsystems is delighted to announce a new UK partnership with Struers Ltd., the UK’s leading manufacturer of equipment, consumables, and services for materialographic analysis. Leica microscopes, accessories, and imaging products specifically designed for industrial and material analysis applications will now also be available from Struers Ltd. […]
Most Advanced s-Scanning Near-field Optical Microscopy/Atomic Force Microscopy-IR System Commercially Available AMSTERDAM — At the 4th Annual European Forum on Nanoscale IR Spectroscopy, Bruker (Nasdaq: BRKR) today announced the release of the nanoIR3-s Broadband™, the most advanced nanoscale FTIR spectroscopy system available to researchers. The system combines Bruker’s industry-leading, high-performance, nanoIR3-s s-SNOM (scattering Scanning Near-field Optical Microscopy) based platform with […]
Oxford Instruments today announced the launch of the new Ergo™️ software platform for their Asylum Research atomic force microscopes (AFMs). Based on the acclaimed AZtec® software interface for Oxford Instruments electron microscope analyzers, Ergo improves the productivity of both infrequent and expert AFM users. A streamlined workflow guides users quickly from setup to data acquisition. Intelligent algorithms automatically […]
A unique combination of plasma FIB and field-free UHR FE-SEM for the widest range of materials characterization applications Brno, Czech Republic – As the first SEM manufacturer to commercialize integrated xenon plasma FIB with the SEM, TESCAN proudly announces TESCAN AMBER X. TESCAN AMBER X is a new FIB-SEM solution that combines high throughput plasma-assisted […]
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IBO (Instrument Business Outlook) is a twice-monthly newsletter aimed at providing decision-makers with the latest and most complete information available on the life science and analytical instrument industry, and lab product markets. IBO delivers the latest curated industry news, information and trends, as well as SDi data and analysis to deliver the maximum in industry insight with a minimum time investment for executives and investors.
