Celebrating 10 Years of Desktop SEM Innovation Phoenix, Arizona Nanoscience Instruments is proud to introduce the 5th generation Phenom Pro and ProX SEMs by Phenom-World. The introduction of this new generation SEM celebrates ten years of Desktop SEM innovation from Phenom World. The new generation features enhanced imaging, 20 percent real electro-optical resolution improvement, new […]

  Three-dimensional models allow height measurements A 3-dimensional model can be generated without sample tilting and alignment, using 4-segment backscattered electron detector. Features Specifications Hitachi map 3D software overview Technical magazine “SI NEWS” This journal addresses a wide range variety of research papers and useful application data using Hitachi science instruments. nanoart Photo collections of […]

– Analytical and Processing Platform for the Development of Advanced Materials and Devices – Tokyo, Japan, August 1, 2017—Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced the development of an all-new high-performance “ETHOS” Focused Ion Beam-Scanning Electron Microscope (FIB-SEM). A newly developed magnetic/electrostatic compound lens enables ETHOS to deliver advanced imaging performance resolving sub-nanometer features […]

Laughton, United Kingdom: Quorum Technologies, market and technology leaders in electron microscopy coating and cryogenic preparation products, talk about how the Physics Department at King’s College, London, chose the Q150T ES coater to deposit gold on samples for high resolution imaging using scanning electron microscopy. William (Bill) Luckhurst heads up the operation and maintenance of […]

San Jose, California Nanolab Technologies Inc., a Silicon Valley-based analytical services lab has completed its current round of investment in new analytical instruments, making it the largest independent advanced microscopy lab in the world. “This is a significant step for us,” said Nanolab President and CEO John Traub, “and greatly increases our capacity to provide extremely high-resolution […]

JEOL Ltd. (President Gon-emon Kurihara) announces the release of a new STEM (scanning transmission electron microscopy) detector “4DCanvas” (pixelated STEM detector), to be released in July 2017. Product development background The recent transmission electron microscope (TEM) enables a sub-Å electron probe to be formed with a spherical aberration corrector (Cs corrector). Owing to Cs correction, atomic-resolution […]

The excellent performance in a wide range of applications offers a serious alternative to floor model SEMs Eindhoven — Phenom-World, the leading global supplier of desktop scanning electron microscopes (SEMs), today introduced its 5th generationPhenom Pro and ProX SEMs. The systems’ enhanced imaging performance, 20 percent resolution improvement, larger choice of detectors and new software […]

Woolpit, United Kingdom: Deben, a leading provider of in-situ testing stages together with innovative accessories and components for electron microscopy, reports on how the School of Materials at the University of Manchester is using a Deben mechanical stage for the characterisation of the structure and behaviour at the micro- and nano- scale relates to that […]

Shimadzu Corporation announces the release of its flagship SPM-8100FM scanning probe microscope, featuring five times faster data acquisition, four times wider scan in both X and Y-axis directions, and ultra-high resolution performance that is as high in both air and liquids as in a vacuum. A scanning probe microscope (SPM) is a microscope that scans […]

Laughton, United Kingdom, 11th July 2017: Quorum Technologies, market and technology leaders in electron microscopy coating and cryogenic preparation products, talk about how the Blackett Laboratory of the Physics Department at Imperial College chose the Q150T coater to deposit metals to make plasmonic devices in a fast prototyping and development process. Dr Avi Braun is […]