Enhanced resolution and faster FIB material processing for maximum efficiency ZEISS presents a new generation of focused ion beam scanning electron microscopes (FIB-SEMs) for high-end applications in research and industry. ZEISS Crossbeam 550 features a significant increase in resolution for imaging and material characterization and a speed gain in sample preparation. Nanostructures such as composites, […]

-Review SEM Featuring Pattern Inspection and Measurement Function through Design Data Comparison Analysis- Tokyo, Japan – Hitachi High-Technologies Corporation (TSE:8036, Hitachi High-Tech) announced sales launch of a high-speed defect review SEM CR6300. This new system detects and classifies defects generated in the semiconductor manufacturing process and has newly designed electron microscope optics fitted with multiple […]

(PresseBox) (Berlin) JPK Instruments, a world-leading manufacturer of nanoanalytic instrumentation for research in life sciences and soft matter, works closely with users at the University of Sheffield where their NanoWizard® AFM systems are being used to further understand soft matter and biological systems at the molecular scale in the Hobbs SPM Group in the Department […]

The HT7800 Series – A Next-Generation TEM Meeting and Exceeding the Requirements for a Wide Range of Fields with High-Performance Imaging and Easy Operation Tokyo, Japan–Hitachi High-Technologies Corporation (TSE: 8036, Hitachi High-Tech) announced the development of a new Transmission Electron Microscope (TEM)*1 model, the HT7800 Series, which enters the market starting March 7, 2017. The […]

Oxford Instruments Asylum Research introduces its new SurfRider “HQ-Series” Atomic Force Microscopy (AFM) probes, offering best-in-class performance at budget pricing. HQ probes are high quality silicon probes exclusively manufactured by Asylum and can be used in all commercially-available AFMs. They offer greater ease-of-use, higher quality and improved consistency for repeatable measurements compared to other probes […]

(Peabody, Mass.) – JEOL announces the latest member in its family of high-end transmission electron microscopes, the CryoARM. This highly automated TEM is designed for unattended operation and high throughput imaging of cryo-EM specimens. The CryoARM was initially introduced to a select audience at the 2016 Gordon Research Conference in Hong Kong, M&M 2016 in […]

New partnership strengthens global sales activities for unique ZEISS ORION NanoFab platform The Microscopy business group of ZEISS and the Raith Group agreed to unite their sales and promotional activities for ZEISS ORION NanoFab, the only helium-ion-microscope in the world. ORION NanoFab fabricates sub-10 nm structures and images at 0.5 nm. Combined with a focused […]

Thermo Fisher Scientific’s Cryo-TEM provides critical information for small molecule and biologic drug discovery HILLSBORO, ORE – A new contract research laboratory operated by France-based NovAliX will provide pharmaceutical companies with access to high-resolution cryo-transmission electron microscopy (cryo-TEM) by Thermo Fisher Scientific for facilitating small molecule and biologic drug discovery. NovAliX’s new laboratory will use the […]

Woolpit, United Kingdom: Deben, a leading provider of in-situ testing stages together with innovative accessories and components for electron microscopy, have supplied leading German instrument manufacturers, JPK Instruments, with a tensile stage to use in conjunction with the world-renowned NanoWizard® AFM platform. Dr Torsten Mueller is a member of the development team with German nanoscience […]