Park Systems Announces Revolutionary Single Click Software SmartScan Available on Park XE Series Atomic Force Microscopes

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SANTA CLARA, CA Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997, just announced that Park SmartScan a powerful AFM operating software that drastically boosts productivity single click reliable nanoscale images is now available on Park XE series AFMs. SmartScan completely automatizes all of the functions of setting up and taking the image once done manually by the […]

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Oxford Instruments Asylum Research Announces the New Cypher VRS Video-Rate Atomic Force Microscope

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Oxford Instruments Asylum Research announces the new Cypher VRS Video-Rate AFM, the first and only full-featured video-rate atomic force microscope (AFM). The Cypher VRS sets a new benchmark for speed, enabling high resolution imaging of dynamic events at up to 625 lines/second, corresponding to about 10 frames per second. For comparison, this is about 300x faster than […]

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Bruker Announces Acquisition of Nanoindenting Leader Hysitron

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ACQUISITION STRENGTHENS BRUKER’S LEADING POSITION IN NANOANALYSIS AND NANOMECHANICAL MATERIALS CHARACTERIZATION BILLERICA, Mass. — Bruker today announced that it has acquired Hysitron, Inc., a technology leader in the development, manufacture, and sale of nanomechanical test instrumentation. The acquisition adds Hysitron’s innovative nanomechanical testing instruments to Bruker’s existing portfolio of atomic force microscopes (AFMs), surface profilometers, and tribology and mechanical testing […]

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