Oxford, England — Oxford Instruments today launches the world’s first imaging detector to combine Backscattered Electron and X-ray imaging in a single technique – BEX. Unity enables researchers, scientists, and students to achieve instant visual and compositional sample analysis simultaneously in the Scanning Electron Microscope (SEM). Traditionally, determining the elemental makeup and composition of materials in […]

Understanding cellular ultrastructure in 3D context with ZEISS Volutome WHITE PLAINS, N.Y. — The newly introduced ZEISS Volutome is an in-chamber ultramicrotome for ZEISS field emission scanning electron microscopes (FE-SEM). It is designed to image the ultrastructure of biological, resin-embedded samples in 3D in life sciences. Scanning electron microscopy (SEM) in general can be used to […]

Oxford Instruments plc, which provides high-technology products and systems to the world’s leading companies and scientific research communities, has today announced the forthcoming retirement, with the agreement of the Board, of Chief Executive Ian Barkshire, who will leave after seven years as Chief Executive and more than 25 years with the company.  Richard Tyson, currently […]

This launch of LiteScope 2.5 marks a milestone in In-Situ Correlative Microscopy and has the potential to revolutionize the way you perform correlative analysis. Text: The new generation of LiteScope AFM-in-SEM is built on the completely new state-of-the-art control unit NenoBox leveraging the performance and capabilities of the AFM-in-SEM to a new level. The heart of the new control unit is the Open […]

PLEASANTON, CA  – Gatan, Inc., a global leader focused on enhancing and extending the operation and productivity of electron microscopes, has merged with EDAX, LLC, a leader in X-ray microanalysis and electron diffraction instrumentation. The combined organization will retain the Gatan name, offering the ultimate suite of tools for transmission electron (TEM) and scanning electron […]

Shanghai Winner International Trading CO. LTD and DECTRIS Ltd. sign a distribution agreement for DECTRIS hybrid-pixel electron-counting detectors in China. Science and technology know no borders! However, there are some barriers. One of them is the language, another is distance. At DECTRIS, we have always tried our best to overcome these hurdles, from opening sales […]

Oxford Instruments is stepping up its commitment to developing talent, as it looks to take on its biggest ever cohort of apprentices for 2023 and beyond. Timed to coincide with National Apprenticeship Week (6-12 February 2023), the company’s 2023 apprenticeship recruitment programme will see it offer 25 apprenticeships of up to four years’ duration in […]

Peabody, MA — JEOL has developed a new Focused Ion Beam (FIB) solution for preparation of specimens prior to observation in the Transmission Electron Microscope (TEM). The new JIB-PS500i is a multipurpose FIB-SEM that delivers the synergy of fast sample preparation, SEM imaging and EDS analysis in a single instrument. High Quality Fast TEM Sample Preparation The […]

EOL Ltd. (President & CEO Izumi Oi) announces its launch of the FIB-SEM system “JIB-PS500i” on February 1, 2023. With the finer structure of advanced materials and advancing complexity of processes, evaluation techniques such as morphological observation and elemental analysis require higher resolution and precision. In the preparation of samples for transmission electron microscopes (TEM) […]

Brno, Czech Republic – Global investment firm Carlyle (NASDAQ: CG) announced today that it has agreed to acquire a majority stake in TESCAN ORSAY HOLDING, a.s. (“TESCAN”), a leading manufacturer of electron microscopes and other high-tech scientific instruments. The terms of the transaction were not disclosed. Founded in 1991 and headquartered in Brno, Czech Republic, […]