CROSS SECTION POLISHER™(CP)is widely utilized in the fields of electronic parts, ceramics, life science, metal, battery, and polymer. The mechanical high-quality uniform cross section can be easily prepared for complex materials and fragile specimens. With a sales record of over 2,000 units since its launch in 2003, the CP has been an essential tool for […]

TM4000PlusIII Tokyo – Hitachi High-Tech Corporation (“Hitachi High-Tech”) announced today the global launch of TM4000PlusIII (“TM4000PlusIII”) and TM4000III (“TM4000III”) Tabletop Microscopes equipped with support features for automation and stable operation. The TM Series shrinks the electron microscope to a size capable of being mounted on a tabletop. Thanks to their compact size and ease of […]

TM4000PlusIII Tokyo — Hitachi High-Tech Corporation (“Hitachi High-Tech”) announced today the global launch of TM4000PlusIII (“TM4000PlusIII”) and TM4000III (“TM4000III”) Tabletop Microscopes equipped with support features for automation and stable operation. The TM Series shrinks the electron microscope to a size capable of being mounted on a tabletop. Thanks to their compact size and ease of installation, […]

CIQTEK has announced the successful installation of the SEM3200, a high-performance tungsten filament scanning electron microscope, at the prestigious Monterrey University laboratory. This advanced imaging system is set to revolutionize research in the field of characterize analysis and contribute to breakthroughs in various scientific fields. Monterrey University, Mexico Expressing excitement about the newly installed SEM3200, the Principal Investigator of the […]

Berwyn, Pa. – AMETEK, Inc. (NYSE: AME) today announced the appointment of Rob Rideout Jr. as Vice President, Strategic Procurement. “I am delighted to promote Rob to Vice President, Strategic Procurement,” said David A. Zapico, AMETEK Chairman and Chief Executive Officer. “Rob’s exceptional leadership and expertise in supply chain management have been invaluable. We are […]

Oxford, UK – Hitachi High-Tech Analytical Science, a Hitachi High-Tech Corporation wholly owned subsidiary engaged in the manufacture and sales of analysis and measuring instruments, has opened a new state-of-the-art applications laboratory in Krefeld, Germany. The new applications laboratory located at the Hitachi High-Tech European head office combines the strengths of Hitachi High-Tech’s core technology […]

AMBER X 2 delivers advancements in plasma FIB technology to further close the performance gap between Ga FIB and plasma FIB Brno, Czech Republic – TESCAN, in collaboration with Orsay Physics, announces the launch of AMBER X 2, a groundbreaking plasma FIB-SEM system designed to set new standards for materials science research. This state-of-the-art technology […]

Photo from the opening ceremony of the center (Left: Executive Vice President of Taiwan University, Wanjiun Liao / Right: Executive Officer of Hitachi High-Tech, Ken Iizumi) Tokyo, July 25, 2024 – Hitachi High-Tech Corporation (“Hitachi High-Tech”) and National Taiwan University (“Taiwan University”) has established the Advanced Application Innovation Center for Focused Ion Beam System (“the […]

JEOL Ltd.(President and CEO: Izumi Oi) has established the JEOL-Taiwan Advanced Semiconductor Solution Center (JTASC) in Zhubei City, Hsinchu County, Taiwan to provide enhanced total solutions to contribute to the further development of the semiconductor industry in the Taiwan region. At the opening ceremony held on Thursday, July 11, there were many guests from industry, […]

AMBER 2 debuts at M&M 2024 with New Tools for TEM Sample Preparation Brno, Czech Republic – TESCAN, a leading provider of scientific instrumentation, announces the launch of the TESCAN AMBER 2, the fourth generation of the TESCAN gallium FIB-SEM platform and the successor to the current AMBER generation, at the Microscopy & Microanalysis (M&M) Expo […]