Uppsala, Sweden & Mainz, Germany – Scienta Omicron, a world-leading provider of surface science instrumentation, Surface Concept GmbH, a pioneer in ultrafast particle detection technologies and Momentum Microscopy, and GST mbH, founded by Momentum Microscopy pioneer Prof. Gerd Schönhense, jointly announce a strategic collaboration to advance the future of Momentum Microscopy. A New Joint Effort to Develop the […]

In the previous year, CIQTEK made significant progress in its European expansion, with Italy standing out as one of the most successful and dynamic markets. CIQTEK SEM Installations Boost Presence in Italy To date, nearly ten CIQTEK SEM microscopes have been delivered and installed across four regions in Italy, covering a full range of models from field-emission SEMs and advanced tungsten filament […]

Brno, Czech Republic — Tescan expands its semiconductor portfolio with FemtoChisel, a next-generation femtosecond laser platform designed to enhance semiconductor sample preparation workflows with exceptional speed, precision, reproducibility, and quality. The instrument will be officially unveiled at ISTFA 2025 in Pasadena, CA. FemtoChisel was developed specifically for semiconductor research and failure analysis environments where both throughput […]

Accelerating the expansion of digitalized assets and the deployment of Lumada 3.0 with a focus on the semiconductor field through the launch of a flagship model Ultrahigh-Resolution Scanning Electron Microscope SU9600 Tokyo  – Hitachi High-Tech Corporation (“Hitachi High-Tech”), has launched the Ultrahigh-Resolution Scanning Electron Microscope SU9600, which allows for highly accurate and precise observation of […]

New solution uses automated 3D metrology to increase productivity in fabrication environments WALTHAM, Mass.–From smartphones to autonomous cars to AI supercomputers, nearly every electronic innovation we use today depends on complicated structures at the atomic scale within silicon chips. As these chips increase in processing power and decrease in size, even the smallest fault can […]

WALTHAM, Mass. —  Thermo Fisher Scientific Inc. (NYSE: TMO), the world leader in serving science, announced plans to further increase the impact of Thermo Fisher’s proven growth strategy through the use of artificial intelligence (AI) with OpenAI. This collaboration will help to improve the speed and success of drug development, enabling customers to get medicines […]

CIQTEK has taken another important step forward in Europe with the installation of the SEM4000Pro Field Emission Scanning Electron Microscope (FE-SEM) at the SYNERGIE4 demonstration showroom in France. The new setup allows researchers and industrial users in Europe to experience high-resolution imaging, analytical performance, and ease of operation offered by the CIQTEK SEM4000Pro. The system provides outstanding image quality for fine microstructural observation […]

In life sciences, achieving high-precision and large-scale 3D structural and dynamic analysis of biological samples such as cells and tissues has become key to breaking through research bottlenecks. CIQTEK has introduced a multi-technology-route Volumetric Electron Microscopy (VEM) solution, integrating SS-SEM, SBF-SEM, and FIB-SEM. This provides an all-around, high-performance, and intelligent platform for biological 3D reconstruction, helping researchers uncover the micro-level mysteries of […]

Research on the microscopic behavior of materials is entering a new era of multi-scenario coupling and in-situ dynamic characterization. CIQTEK has launched an innovative In-situ Mechanical Testing Solution, designed with outstanding openness and compatibility. It enables seamless integration of CIQTEK’s full range of electron microscopes with mainstream in-situ testing devices, providing a flexible and efficient platform for coupled analysis in diverse […]

Four-dimensional scanning transmission electron microscopy (4D-STEM) is one of the most cutting-edge directions in electron microscopy. By performing a two-dimensional scan across the sample surface while recording a full diffraction pattern at each scan point with a pixelated detector, 4D-STEM generates a four-dimensional dataset containing both real-space and reciprocal-space information. This technique breaks through the limitations […]