LAS X.next, a streamlined software user interface for the DVM6 digital microscope Leica Microsystems introduces LAS X.next, the new streamlined software user interface for the DVM6 digital microscope. Together, they facilitate the acquisition of 2D and 3D scanned images in significantly less time. Users are able to do detailed component analysis for R&D, QC, and failure analysis (FA) […]

Pittcon 2019 – Philadelphia, PA JEOL USA introduces our 4th generation benchtop Scanning Electron Microscope (SEM) that delivers many powerful features of a full-sized SEM in a small package. The new JEOL NeoScope™ (model JCM-7000) will be demonstrated in booth #3035 at Pittcon 2019 in Philadelphia. This benchtop SEM’s advanced technology and functions make it […]

Mannheim, Germany Park Systems, a leading innovator of atomic force microscopy (AFM) technology, proudly announces the opening of a new European subsidiary in Orsay, France. As a fast-paced manufacturer of nanoscale microscopy and metrology products, Park Systems expends its leadership in Europe by establishing Park Systems France. The new European office will serve French, Spanish […]

Jena — Jenoptik signs long-term agreement to develop and produce microscopy imaging instrument with leading life science company based on the technology platform JENOPTIK SYIONS. The scope of the agreement is anticipated to exceed 30 million euros for the coming years. The SYIONS system allows customers to take advantage of a range of imaging technologies and […]

JEOL Ltd. (President Gon-emon Kurihara) announces the release of a new benchtop scanning electron microscope (SEM), the JCM-7000 series NeoScope™, to be released in March 2019. Product development background Benchtop scanning electron microscopes are used in a wide range of fields, such as electrical, electronics, automobiles, machinery, chemical, and pharmaceutical industries. In addition, SEM applications […]

ZEISS ZEN Connect for the materials research lab JENA/Germany. ZEISS ZEN Connect software module is now available for materials researchers at universities, multi-user facilities or industrial labs. It enables users to bring all imaging technologies together – ZEISS or otherwise – to answer their questions. Gaining unique insights and saving time ZEISS ZEN Connect allows […]

Oxford Instruments Asylum Research announces the new Jupiter XR Atomic Force Microscope (AFM), the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and the versatility to excel in both academic research […]

Making materials laboratories more productive JENA/Germany ZEISS ZEN core is a powerful software suite for microscopy imaging, automated analyses, and multi-modal workflows in connected materials laboratory environments. With the new release, materials researchers are now even more efficient. ZEISS ZEN core is not only used as a powerful tool for image analysis and interactive control […]

Partnership outlines 5-year strategic plan to tackle challenges in NDT Montréal, Quebec – Olympus is proud to announce the launch of the Olympus Industrial Research Chair on Ultrasonic Nondestructive Testing with the Quebec engineering school, École de technologie supérieure (ÉTS). Pierre Bélanger, ETS Professor, was joined by his team and representatives from Olympus, the world’s […]

Sydney, Australia – AXT and QUT (Queensland University of Technology) are pleased to announce that QUT have just ordered a TESCAN S8000X Xe plasma FIB-SEM. The S8000X is a next-generation FIB-SEM that offers unrivalled versatility, ultra-high-resolution imaging and high-speed nanomachining capabilities. It will be one of the flagship instruments at QUT’s Central Analytical Research Facility (CARF) […]