Imaging Spectroscopic Ellipsometry and Active Vibration Isolation Add to Park’s Nanometrology Business Portfolio. Park Systems Corp. today announced that it has acquired Accurion GmbH, a privately held company that develops and manufactures imaging spectroscopic ellipsometers and active vibration isolations. This acquisition adds to Park’s portfolio of atomic force microscopy and white-light interferometric microscopy. Financial details […]

The prizes go to scientists from the US, Germany and China The WITec Paper Awards 2022 have been given to scientists from the US, Germany and China, recognizing their work in cement chemistry, pharmacy and methane hydrate chemistry. Every year, the WITec Paper Award highlights three scientific publications that contain data acquired with a WITec […]

Santa Barbara, CA — Oxford Instruments Asylum Research today announced the launch of the new Cypher L atomic force microscope (AFM). Based on the acclaimed high-performance Cypher AFM platform, the Cypher L is designed for researchers who need core AFM capabilities in research markets including polymers, 2D materials, quantum technology, and energy storage. The Cypher […]

SUWON, South Korea — Park Systems, the world’s leading manufacturer of atomic force microscopes (AFM) is proud to award the Park Systems AFM Scholarship to Gen Liu at Tianjin International Center for Nanoparticles and Nanosystems (TICNN), Tianjin University, China for his research on SECCM. Scanning electrochemical cell microscope is the latest generation of scanning electrochemical microscopy technology. It is designed to […]

Pursuing improved sensitivity when measuring physical properties and measurement at atomic and molecular scales Tokyo – Hitachi High-Tech Corporation (“Hitachi High-Tech”) today announced the launch of the AFM100 Pro High-Sensitivity Scanning Probe Microscope System, a high-end scanning probe microscope (AFM*1/SPM*2) equipped with a newly developed high-sensitivity optical head that improves sensitivity when measuring physical properties and […]

To promote integrated solution developments in electron microscope and probe microscope related businesses by strengthened collaborations with customers TOKYO – Hitachi High-Tech Corporation today announced the opening of its new demonstration and collaboration base “Advanced-Technology Innovation Center Naka (ACN)” in the city of Hitachinaka, Ibaraki Prefecture. This facility will function as a site to demonstrate […]

(Santa Barbara, CA).  Oxford Instruments Asylum Research announces the release of the HVA150 – high voltage accessory for the Jupiter XR atomic force microscope (AFM). HVA150 expands the bias range that can be used during AFM experiments up to ±150 V, allowing for advanced AFM characterization of piezoelectric & ferroelectrics materials, 2D materials and thin […]

For the correlative analysis of Raman, AFM, AFM-Raman, cathodoluminescence and fluorescence data and microscopy images (optical, scanning probe microscopy, electron microscopy) Palaiseau, Saclay Campus, France, and Besançon, France World leader in Raman microscopy and nanoscopy, HORIBA Scientific and Digital Surf, creator of the Mountains® software platform for image and surface analysis in microscopy and metrology, […]

Zurich – DKSH Business Unit Technology has entered a partnership with ICSPI, an innovative manufacturer of single-chip scanning probe microscopes for educational, research and industrial applications. DKSH will provide sales, marketing, and after-sales services in Thailand, Vietnam, Malaysia, Philippines, Indonesia, Singapore, Australia, New Zealand, Korea and Taiwan. ICSPI is on a mission to bring robust, […]

SPECS regrets to interrupt its business activities with immediate effect At SPECS we have a responsibility and obligation, aligned with other global businesses, to respond to the Russian government’s ongoing military attack on Ukraine. The scientific family is a truly global family devoted to peace and the scientific merit to make the world a better […]