Oxford Instruments today announced the launch of the new Ergo™️ software platform for their Asylum Research atomic force microscopes (AFMs). Based on the acclaimed AZtec® software interface for Oxford Instruments electron microscope analyzers, Ergo improves the productivity of both infrequent and expert AFM users. A streamlined workflow guides users quickly from setup to data acquisition. Intelligent algorithms automatically […]

New NanoWizard 4 XP Provides Extreme Imaging Performance and Ease of Use MUENSTER, Germany –At the 9th AFM BioMed Conference, Bruker Corporation (Nasdaq: BRKR) today announced the release of the NanoWizard® 4 XPextreme performance Bio-AFM system. The new system integrates Bruker’s exclusive PeakForce Tapping®, which enables both superior force control and unparalleled AFM ease of use, and industry-leading QI™ […]

The EIKOS-UV enables routine, high performance 3D nanoanalysis for a wide variety of industrial and research applications Madison, WI, USA – AMETEK CAMECA, a world leader in scientific instrumentation and metrology solutions, is pleased to announce the release of EIKOS-UV, a new atom probe microscope. EIKOS-UV is a workhorse Atom Probe Microscope with increased ease […]

KMLabs, Inc., the leader in ultrafast laser technology, today introduces the QM Quantum Microscope for next-generation imaging and analysis. This system is built on the company’s unique, coherent extreme ultraviolet (EUV) and vacuum ultraviolet laser (VUV) sources. The modular QM platform enables high contrast, near-surface-to-subsurface coherent imaging at the nanoscale and can be configured for […]

Please accept our sincere gratitude for using Hitachi High-Tech Science (formerly SII NanoTechnology Inc. (SIINT)) atomic force microscopes for a lengthy period of time. While we make significant efforts to prolong the useful lifetime of our instruments and ensure that customers get a good value for their purchase, increases in parts prices and the lack […]

Mannheim, Germany Park Systems, a leading innovator of atomic force microscopy (AFM) technology, proudly announces the opening of a new European subsidiary in Orsay, France. As a fast-paced manufacturer of nanoscale microscopy and metrology products, Park Systems expends its leadership in Europe by establishing Park Systems France. The new European office will serve French, Spanish […]

Oxford Instruments Asylum Research announces the new Jupiter XR Atomic Force Microscope (AFM), the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and the versatility to excel in both academic research […]

AMSBIO is a leading supplier of gold, silver and platinum coated substrates for nanotechnology researchers looking to use these surfaces to characterize self-assembled monolayers using atomic force microscopy (AFM), or scanning tunneling microscopy (STM). Gold, silver and platinum surfaces offer a clean, near atomically-flat surface that is ideal for applications in nanotechnology, such as studies on self-assembly, single-molecule […]

JPK NanoWizard ULTRA Speed 2 Combines Innovative AFM Capabilities for Correlative Microscopy BERLIN — Bruker today announced the release of the JPK NanoWizard® ULTRA Speed 2 advanced AFM system, which combines highest speed and highest resolution AFM with advanced bio-imaging features. Developed in close collaboration with their expanded worldwide user base, the system is the first new product […]

LOS ALTOS, Calif. — Bioz Inc., a company that has developed the world’s first and most comprehensive A.I. search engine for scientific experimentation, today announced an expansion of its advisory board with the addition of Professor Alon Halevy, a world-leading expert in A.I., Machine Learning (ML) and Natural Language Processing (NLP). Professor Halevy, recipient of the Presidential Early Career Award for Scientists […]