Santa Barbara, CA — Oxford Instruments Asylum Research today announces the release of its new nanoscale time-dependent dielectric breakdown (nanoTDDB) high voltage accessory for the Jupiter XR atomic force microscope (AFM). The NanoTDDB technique measures the voltage at which a material undergoes dielectric breakdown. This unique nanoTDDB accessory expands the range of electrical characterization tools available […]

Park Systems, a leading manufacturer of atomic force microscopy (AFM) systems, expands its business portfolio by acquiring Accurion GmbH, a Germany-based company that develops and manufactures imaging spectroscopic ellipsometers (ISE) and active vibration isolations (AVI). To celebrate this strategic expansion, the M&A ceremony took place last Friday, October 14, 2022, in Goettingen, Germany, gathering both […]

SEOUL, South Korea — Park Methods, world-leading producer of Atomic Pressure Microscopes declares Park SmartAnalysis, a next-gen picture processing and information evaluation software program is now obtainable for all Park AFM’s that includes superior picture processing capabilities. SmartAnalysis supplies varied instruments to research, measure, and carry out statistics from the AFM picture and information, that speeds […]

Imaging Spectroscopic Ellipsometry and Active Vibration Isolation Add to Park’s Nanometrology Business Portfolio. Park Systems Corp. today announced that it has acquired Accurion GmbH, a privately held company that develops and manufactures imaging spectroscopic ellipsometers and active vibration isolations. This acquisition adds to Park’s portfolio of atomic force microscopy and white-light interferometric microscopy. Financial details […]

The prizes go to scientists from the US, Germany and China The WITec Paper Awards 2022 have been given to scientists from the US, Germany and China, recognizing their work in cement chemistry, pharmacy and methane hydrate chemistry. Every year, the WITec Paper Award highlights three scientific publications that contain data acquired with a WITec […]

Santa Barbara, CA — Oxford Instruments Asylum Research today announced the launch of the new Cypher L atomic force microscope (AFM). Based on the acclaimed high-performance Cypher AFM platform, the Cypher L is designed for researchers who need core AFM capabilities in research markets including polymers, 2D materials, quantum technology, and energy storage. The Cypher […]

SUWON, South Korea — Park Systems, the world’s leading manufacturer of atomic force microscopes (AFM) is proud to award the Park Systems AFM Scholarship to Gen Liu at Tianjin International Center for Nanoparticles and Nanosystems (TICNN), Tianjin University, China for his research on SECCM. Scanning electrochemical cell microscope is the latest generation of scanning electrochemical microscopy technology. It is designed to […]

Pursuing improved sensitivity when measuring physical properties and measurement at atomic and molecular scales Tokyo – Hitachi High-Tech Corporation (“Hitachi High-Tech”) today announced the launch of the AFM100 Pro High-Sensitivity Scanning Probe Microscope System, a high-end scanning probe microscope (AFM*1/SPM*2) equipped with a newly developed high-sensitivity optical head that improves sensitivity when measuring physical properties and […]

To promote integrated solution developments in electron microscope and probe microscope related businesses by strengthened collaborations with customers TOKYO – Hitachi High-Tech Corporation today announced the opening of its new demonstration and collaboration base “Advanced-Technology Innovation Center Naka (ACN)” in the city of Hitachinaka, Ibaraki Prefecture. This facility will function as a site to demonstrate […]

(Santa Barbara, CA).  Oxford Instruments Asylum Research announces the release of the HVA150 – high voltage accessory for the Jupiter XR atomic force microscope (AFM). HVA150 expands the bias range that can be used during AFM experiments up to ±150 V, allowing for advanced AFM characterization of piezoelectric & ferroelectrics materials, 2D materials and thin […]