Partnership Includes Providing Services to Leading Edge Biotech Researchers Santa Barbara, CA and Sunnyvale, CA — Oxford Instruments Asylum Research and Covalent Metrology Services announced today that the two companies have signed a joint collaboration aimed at further developing and promoting commercial applications for several advanced modes of atomic force microscopy (AFM). Oxford Instruments Asylum Research designs […]

Santa Barbara, CA — Oxford Instruments Asylum Research is pleased to announce the release of a new Scanning Capacitance Microscopy (SCM) accessory for its Cypher and Jupiter XR atomic force microscopes (AFMs). SCM is a powerful imaging technique that can map electric charge carrier locations, types (p-type vs. n-type), and relative dopant concentration in semiconductors […]