EAG Laboratories Launches New Laboratory in China

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EAG Laboratories proudly announces the launch of a new laboratory in China dedicated to improving materials, products and electronics. Newly built in Shanghai, this facility brings the most advanced imaging and surface analysis expertise and technology to China, providing manufacturers with direct access to scientific expertise in the analysis of physical structures, chemical properties and […]

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ZEISS introduces next generation X-ray microscopes

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ZEISS Xradia 600-series Versa enables faster submicron-resolution imaging of intact samples JENA/Germany. ZEISS introduces two new advanced models of the ZEISS Xradia Versa family: The ZEISS Xradia 610 & 620 Versa X-ray microscopes excel through faster non-destructive imaging of intact samples without sacrificing resolution and contrast over the full range of power and kV. Leading […]

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Top Gas Detector Supplier RIKEN KEIKI Opens European Facility

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Riken Keiki Co., Ltd. (TSE listed, headquartered in Tokyo, Japan) has established a wholly-owned subsidiary in Frankfurt to expand its sales in European market. The new entity will provide a local source for Riken Keiki’s complete line of fixed systems and portable gas monitors under the name of Riken Keiki GmbH. Official launch will be […]

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Ionoptika Expands

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Ionoptika recently moved to a new factory which provides a three-fold increase in space for offices and manufacturing. The new factory is located in Chandler’s Ford, near Southampton, in the UK. This move, in combination with a significant increase in manpower over the past few months, doubles our capacity for instrument and ion beam manufacture, […]

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TESCAN announces the launch of training network ELENA

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TESCAN is happy to announce the launch of the Horizon 2020 training network ELENA – Low energy ELEctron driven chemistry for the advancement of emerging NAno-fabrication methods. The project is part of the Marie Skłodowska-Curie Innovative Training Network ELENA in which young researchers investigate the chemistry and physics involved in two emerging techniques for creating […]

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Release of the JXA-8530FPlus, a New Electron Probe Microanalyzer – High Throughput Analysis by the Improved Electron Optical System –

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JEOL Ltd. (President Gon-emon Kurihara) announces the release of the JXA-8530FPlus Electron Probe Microanalyzer (EPMA) equipped with the In-Lens Schottky Plus FEG (field emission gun), to be distributed in January 5, 2017. Product development background JEOL commercialized the world’s first FE-EPMA, the JXA-8500F in 2003. This highly regarded FE-EPMA has long been used in various […]

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